Microwave Permittivity of Trace sp(2) Carbon Impurities in Sub-Micron Diamond Powders

[Image: see text] Microwave dielectric loss tangent measurements are demonstrated as a method for quantifying trace sp(2)-hybridized carbon impurities in sub-micron diamond powders. Appropriate test samples are prepared by vacuum annealing at temperatures from 600 to 1200 °C to vary the sp(2)/sp(3)...

Descripción completa

Detalles Bibliográficos
Autores principales: Cuenca, Jerome Alexander, Thomas, Evan Lloyd Hunter, Mandal, Soumen, Morgan, David John, Lloret, Fernando, Araujo, Daniel, Williams, Oliver Aneurin, Porch, Adrian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2018
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6641517/
https://www.ncbi.nlm.nih.gov/pubmed/31458523
http://dx.doi.org/10.1021/acsomega.7b02000

Ejemplares similares

Ejemplares similares