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Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe

We present the practical resolution limit of a fine electrical structure based on a fiber-coupled electro-optic probing system. The spatial resolution limit was experimentally evaluated on the sub-millimeter to micrometer scale of planar electrical transmission lines. The electrical lines were fabri...

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Autores principales: Hong, Young-Pyo, Lee, Kyung-Min, Kim, Sung-Yeol, Lim, Meehyun, Kim, Taekjin, Yong, Hyung-Jung, Lee, Dong-Joon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6651240/
https://www.ncbi.nlm.nih.gov/pubmed/31261698
http://dx.doi.org/10.3390/s19132874
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author Hong, Young-Pyo
Lee, Kyung-Min
Kim, Sung-Yeol
Lim, Meehyun
Kim, Taekjin
Yong, Hyung-Jung
Lee, Dong-Joon
author_facet Hong, Young-Pyo
Lee, Kyung-Min
Kim, Sung-Yeol
Lim, Meehyun
Kim, Taekjin
Yong, Hyung-Jung
Lee, Dong-Joon
author_sort Hong, Young-Pyo
collection PubMed
description We present the practical resolution limit of a fine electrical structure based on a fiber-coupled electro-optic probing system. The spatial resolution limit was experimentally evaluated on the sub-millimeter to micrometer scale of planar electrical transmission lines. The electrical lines were fabricated to have various potential differences depending on the dimensions and geometry. The electric field between the lines was measured through an electro-optic probe, which was miniaturized up to the optical bare fiber scale so as to investigate the spatial limit of electrical signals with minimal invasiveness. The experimental results show that the technical resolution limitation of a fiber-coupled probe can reasonably approach a fraction of the mode field diameter (~10 μm) of the fiber in use.
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spelling pubmed-66512402019-08-07 Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe Hong, Young-Pyo Lee, Kyung-Min Kim, Sung-Yeol Lim, Meehyun Kim, Taekjin Yong, Hyung-Jung Lee, Dong-Joon Sensors (Basel) Article We present the practical resolution limit of a fine electrical structure based on a fiber-coupled electro-optic probing system. The spatial resolution limit was experimentally evaluated on the sub-millimeter to micrometer scale of planar electrical transmission lines. The electrical lines were fabricated to have various potential differences depending on the dimensions and geometry. The electric field between the lines was measured through an electro-optic probe, which was miniaturized up to the optical bare fiber scale so as to investigate the spatial limit of electrical signals with minimal invasiveness. The experimental results show that the technical resolution limitation of a fiber-coupled probe can reasonably approach a fraction of the mode field diameter (~10 μm) of the fiber in use. MDPI 2019-06-28 /pmc/articles/PMC6651240/ /pubmed/31261698 http://dx.doi.org/10.3390/s19132874 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Hong, Young-Pyo
Lee, Kyung-Min
Kim, Sung-Yeol
Lim, Meehyun
Kim, Taekjin
Yong, Hyung-Jung
Lee, Dong-Joon
Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe
title Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe
title_full Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe
title_fullStr Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe
title_full_unstemmed Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe
title_short Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe
title_sort micrometer scale resolution limit of a fiber-coupled electro-optic probe
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6651240/
https://www.ncbi.nlm.nih.gov/pubmed/31261698
http://dx.doi.org/10.3390/s19132874
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