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InGaP electron spectrometer for high temperature environments
In this work, a 200 μm diameter InGaP (GaInP) p(+)-i-n(+) mesa photodiode was studied across the temperature range 100 °C to 20 °C for the development of a temperature-tolerant electron spectrometer. The depletion layer thickness of the InGaP device was 5 μm. The performance of the InGaP detector wa...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6668469/ https://www.ncbi.nlm.nih.gov/pubmed/31366906 http://dx.doi.org/10.1038/s41598-019-47531-8 |
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author | Butera, S. Lioliou, G. Zhao, S. Whitaker, M. D. C. Krysa, A. B. Barnett, A. M. |
author_facet | Butera, S. Lioliou, G. Zhao, S. Whitaker, M. D. C. Krysa, A. B. Barnett, A. M. |
author_sort | Butera, S. |
collection | PubMed |
description | In this work, a 200 μm diameter InGaP (GaInP) p(+)-i-n(+) mesa photodiode was studied across the temperature range 100 °C to 20 °C for the development of a temperature-tolerant electron spectrometer. The depletion layer thickness of the InGaP device was 5 μm. The performance of the InGaP detector was analysed under dark conditions and then under the illumination of a 183 MBq (63)Ni radioisotope beta particle source. The InGaP photodiode was connected to a custom-made low-noise charge-sensitive preamplifier to realise a particle counting electron spectrometer. Beta spectra were collected at temperatures up to 100 °C with the InGaP device reverse biased at 5 V. The spectrum accumulated at 20 °C was compared with the spectrum predicted using Monte Carlo simulations; good agreement was found between the predicted and experimental spectra. The work is of importance for the development of electron spectrometers that can be used for planetary and space science missions to environments of high temperature or extreme radiation (e.g. Mercury, Jupiter’s moon Europa, near-Sun comets), as well as terrestrial applications. |
format | Online Article Text |
id | pubmed-6668469 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-66684692019-08-06 InGaP electron spectrometer for high temperature environments Butera, S. Lioliou, G. Zhao, S. Whitaker, M. D. C. Krysa, A. B. Barnett, A. M. Sci Rep Article In this work, a 200 μm diameter InGaP (GaInP) p(+)-i-n(+) mesa photodiode was studied across the temperature range 100 °C to 20 °C for the development of a temperature-tolerant electron spectrometer. The depletion layer thickness of the InGaP device was 5 μm. The performance of the InGaP detector was analysed under dark conditions and then under the illumination of a 183 MBq (63)Ni radioisotope beta particle source. The InGaP photodiode was connected to a custom-made low-noise charge-sensitive preamplifier to realise a particle counting electron spectrometer. Beta spectra were collected at temperatures up to 100 °C with the InGaP device reverse biased at 5 V. The spectrum accumulated at 20 °C was compared with the spectrum predicted using Monte Carlo simulations; good agreement was found between the predicted and experimental spectra. The work is of importance for the development of electron spectrometers that can be used for planetary and space science missions to environments of high temperature or extreme radiation (e.g. Mercury, Jupiter’s moon Europa, near-Sun comets), as well as terrestrial applications. Nature Publishing Group UK 2019-07-31 /pmc/articles/PMC6668469/ /pubmed/31366906 http://dx.doi.org/10.1038/s41598-019-47531-8 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Butera, S. Lioliou, G. Zhao, S. Whitaker, M. D. C. Krysa, A. B. Barnett, A. M. InGaP electron spectrometer for high temperature environments |
title | InGaP electron spectrometer for high temperature environments |
title_full | InGaP electron spectrometer for high temperature environments |
title_fullStr | InGaP electron spectrometer for high temperature environments |
title_full_unstemmed | InGaP electron spectrometer for high temperature environments |
title_short | InGaP electron spectrometer for high temperature environments |
title_sort | ingap electron spectrometer for high temperature environments |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6668469/ https://www.ncbi.nlm.nih.gov/pubmed/31366906 http://dx.doi.org/10.1038/s41598-019-47531-8 |
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