Optical Contrast and Raman Spectroscopy Techniques Applied to Few-Layer 2D Hexagonal Boron Nitride

The successful integration of few-layer thick hexagonal boron nitride (hBN) into devices based on two-dimensional materials requires fast and non-destructive techniques to quantify their thickness. Optical contrast methods and Raman spectroscopy have been widely used to estimate the thickness of two...

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Detalles Bibliográficos
Autores principales: Krečmarová, Marie, Andres-Penares, Daniel, Fekete, Ladislav, Ashcheulov, Petr, Molina-Sánchez, Alejandro, Canet-Albiach, Rodolfo, Gregora, Ivan, Mortet, Vincent, Martínez-Pastor, Juan P., Sánchez-Royo, Juan F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6669639/
https://www.ncbi.nlm.nih.gov/pubmed/31336572
http://dx.doi.org/10.3390/nano9071047

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6669639/
https://www.ncbi.nlm.nih.gov/pubmed/31336572
http://dx.doi.org/10.3390/nano9071047

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