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Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide

The class of transparent conductive oxides includes the material indium tin oxide (ITO) and has become a widely used material of modern every-day life such as in touch screens of smart phones and watches, but also used as an optically transparent low electrically-resistive contract in the photovolta...

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Autores principales: Gui, Yaliang, Miscuglio, Mario, Ma, Zhizhen, Tahersima, Mohammad H., Sun, Shuai, Amin, Rubab, Dalir, Hamed, Sorger, Volker J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6677887/
https://www.ncbi.nlm.nih.gov/pubmed/31375787
http://dx.doi.org/10.1038/s41598-019-47631-5
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author Gui, Yaliang
Miscuglio, Mario
Ma, Zhizhen
Tahersima, Mohammad H.
Sun, Shuai
Amin, Rubab
Dalir, Hamed
Sorger, Volker J.
author_facet Gui, Yaliang
Miscuglio, Mario
Ma, Zhizhen
Tahersima, Mohammad H.
Sun, Shuai
Amin, Rubab
Dalir, Hamed
Sorger, Volker J.
author_sort Gui, Yaliang
collection PubMed
description The class of transparent conductive oxides includes the material indium tin oxide (ITO) and has become a widely used material of modern every-day life such as in touch screens of smart phones and watches, but also used as an optically transparent low electrically-resistive contract in the photovoltaics industry. More recently ITO has shown epsilon-near-zero (ENZ) behavior in the telecommunication frequency band enabling both strong index modulation and other optically-exotic applications such as metatronics. However, the ability to precisely obtain targeted electrical and optical material properties in ITO is still challenging due to complex intrinsic effects in ITO and as such no integrated metatronic platform has been demonstrated to-date. Here we deliver an extensive and accurate description process parameter of RF-sputtering, showing a holistic control of the quality of ITO thin films in the visible and particularly near-infrared spectral region. We are able to custom-engineer the ENZ point across the telecommunication band by explicitly controlling the sputtering process conditions. Exploiting this control, we design a functional sub-wavelength-scale filter based on lumped circuit-elements, towards the realization of integrated metatronic devices and circuits.
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spelling pubmed-66778872019-08-08 Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide Gui, Yaliang Miscuglio, Mario Ma, Zhizhen Tahersima, Mohammad H. Sun, Shuai Amin, Rubab Dalir, Hamed Sorger, Volker J. Sci Rep Article The class of transparent conductive oxides includes the material indium tin oxide (ITO) and has become a widely used material of modern every-day life such as in touch screens of smart phones and watches, but also used as an optically transparent low electrically-resistive contract in the photovoltaics industry. More recently ITO has shown epsilon-near-zero (ENZ) behavior in the telecommunication frequency band enabling both strong index modulation and other optically-exotic applications such as metatronics. However, the ability to precisely obtain targeted electrical and optical material properties in ITO is still challenging due to complex intrinsic effects in ITO and as such no integrated metatronic platform has been demonstrated to-date. Here we deliver an extensive and accurate description process parameter of RF-sputtering, showing a holistic control of the quality of ITO thin films in the visible and particularly near-infrared spectral region. We are able to custom-engineer the ENZ point across the telecommunication band by explicitly controlling the sputtering process conditions. Exploiting this control, we design a functional sub-wavelength-scale filter based on lumped circuit-elements, towards the realization of integrated metatronic devices and circuits. Nature Publishing Group UK 2019-08-02 /pmc/articles/PMC6677887/ /pubmed/31375787 http://dx.doi.org/10.1038/s41598-019-47631-5 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Gui, Yaliang
Miscuglio, Mario
Ma, Zhizhen
Tahersima, Mohammad H.
Sun, Shuai
Amin, Rubab
Dalir, Hamed
Sorger, Volker J.
Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide
title Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide
title_full Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide
title_fullStr Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide
title_full_unstemmed Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide
title_short Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide
title_sort towards integrated metatronics: a holistic approach on precise optical and electrical properties of indium tin oxide
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6677887/
https://www.ncbi.nlm.nih.gov/pubmed/31375787
http://dx.doi.org/10.1038/s41598-019-47631-5
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