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Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials

An approach for the size measurement of particulate (nano)materials by transmission electron microscopy was evaluated. The approach combines standard operating procedures for specimen preparation, imaging, and image analysis, and it was evaluated on a series of certified reference materials and repr...

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Autores principales: Verleysen, Eveline, Wagner, Thorsten, Lipinski, Hans-Gerd, Kägi, Ralf, Koeber, Robert, Boix-Sanfeliu, Ana, De Temmerman, Pieter-Jan, Mast, Jan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6679035/
https://www.ncbi.nlm.nih.gov/pubmed/31311143
http://dx.doi.org/10.3390/ma12142274
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author Verleysen, Eveline
Wagner, Thorsten
Lipinski, Hans-Gerd
Kägi, Ralf
Koeber, Robert
Boix-Sanfeliu, Ana
De Temmerman, Pieter-Jan
Mast, Jan
author_facet Verleysen, Eveline
Wagner, Thorsten
Lipinski, Hans-Gerd
Kägi, Ralf
Koeber, Robert
Boix-Sanfeliu, Ana
De Temmerman, Pieter-Jan
Mast, Jan
author_sort Verleysen, Eveline
collection PubMed
description An approach for the size measurement of particulate (nano)materials by transmission electron microscopy was evaluated. The approach combines standard operating procedures for specimen preparation, imaging, and image analysis, and it was evaluated on a series of certified reference materials and representative test materials with varying physical properties, including particle size, shape, and agglomeration state. The measurement of the median value of the minimal external particle diameter distribution was intra-laboratory validated. The validation study included an assessment of the limit of detection, working range, selectivity, precision, trueness, robustness, and ruggedness. An uncertainty that was associated to intermediate precision in the range of 1–7% and an expanded measurement uncertainty in the range of 7–20% were obtained, depending on the material and image analysis mode. No bias was observed when assessing the trueness of the approach on the certified reference materials ERM-FD100 and ERM-FD304. The image analysis method was validated in an inter-laboratory study by 19 laboratories, which resulted in a within-laboratory precision in the range of 2–8% and a between-laboratory precision of between 2% and 14%. The automation and standardization of the proposed approach significantly improves labour and cost efficiency for the accurate and precise size measurement of the particulate materials. The approach is shown to be implementable in many other electron microscopy laboratories.
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spelling pubmed-66790352019-08-19 Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials Verleysen, Eveline Wagner, Thorsten Lipinski, Hans-Gerd Kägi, Ralf Koeber, Robert Boix-Sanfeliu, Ana De Temmerman, Pieter-Jan Mast, Jan Materials (Basel) Article An approach for the size measurement of particulate (nano)materials by transmission electron microscopy was evaluated. The approach combines standard operating procedures for specimen preparation, imaging, and image analysis, and it was evaluated on a series of certified reference materials and representative test materials with varying physical properties, including particle size, shape, and agglomeration state. The measurement of the median value of the minimal external particle diameter distribution was intra-laboratory validated. The validation study included an assessment of the limit of detection, working range, selectivity, precision, trueness, robustness, and ruggedness. An uncertainty that was associated to intermediate precision in the range of 1–7% and an expanded measurement uncertainty in the range of 7–20% were obtained, depending on the material and image analysis mode. No bias was observed when assessing the trueness of the approach on the certified reference materials ERM-FD100 and ERM-FD304. The image analysis method was validated in an inter-laboratory study by 19 laboratories, which resulted in a within-laboratory precision in the range of 2–8% and a between-laboratory precision of between 2% and 14%. The automation and standardization of the proposed approach significantly improves labour and cost efficiency for the accurate and precise size measurement of the particulate materials. The approach is shown to be implementable in many other electron microscopy laboratories. MDPI 2019-07-15 /pmc/articles/PMC6679035/ /pubmed/31311143 http://dx.doi.org/10.3390/ma12142274 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Verleysen, Eveline
Wagner, Thorsten
Lipinski, Hans-Gerd
Kägi, Ralf
Koeber, Robert
Boix-Sanfeliu, Ana
De Temmerman, Pieter-Jan
Mast, Jan
Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials
title Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials
title_full Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials
title_fullStr Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials
title_full_unstemmed Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials
title_short Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials
title_sort evaluation of a tem based approach for size measurement of particulate (nano)materials
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6679035/
https://www.ncbi.nlm.nih.gov/pubmed/31311143
http://dx.doi.org/10.3390/ma12142274
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