Physico-elemental analysis of roasted organic coffee beans from Ethiopia, Colombia, Honduras, and Mexico using X-ray micro-computed tomography and external beam particle induced X-ray emission

The physico-elemental profiles of commercially attained and roasted organic coffee beans from Ethiopia, Colombia, Honduras, and Mexico were compared using light microscopy, X-ray micro-computed tomography, and external beam particle induced X-ray emission. External beam PIXE analysis detected P, S,...

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Detalles Bibliográficos
Autores principales: Cloete, Karen J., Šmit, Žiga, Minnis-Ndimba, Roya, Vavpetič, Primož, du Plessis, Anton, le Roux, Stephan G., Pelicon, Primož
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6694858/
https://www.ncbi.nlm.nih.gov/pubmed/31432016
http://dx.doi.org/10.1016/j.fochx.2019.100032

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