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Clustered DNA Damages induced by 0.5 to 30 eV Electrons
Low-energy electrons (LEEs) of energies ≤30 eV are generated in large quantities by ionizing radiation. These electrons can damage DNA; particularly, they can induce the more detrimental clustered lesions in cells. This type of lesions, which are responsible for a large portion of the genotoxic stre...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6695612/ https://www.ncbi.nlm.nih.gov/pubmed/31370253 http://dx.doi.org/10.3390/ijms20153749 |