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Logistic Regression for Machine Learning in Process Tomography
The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasoun...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/ https://www.ncbi.nlm.nih.gov/pubmed/31382513 http://dx.doi.org/10.3390/s19153400 |
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author | Rymarczyk, Tomasz Kozłowski, Edward Kłosowski, Grzegorz Niderla, Konrad |
author_facet | Rymarczyk, Tomasz Kozłowski, Edward Kłosowski, Grzegorz Niderla, Konrad |
author_sort | Rymarczyk, Tomasz |
collection | PubMed |
description | The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasound transmission tomography (UST). The test object was a tank filled with water in which reconstructed objects were placed. For both EIT and UST, a novel approach was used in which each pixel of the output image was reconstructed by a separately trained prediction system. Therefore, it was necessary to use many predictive systems whose number corresponds to the number of pixels of the output image. Thanks to this approach the under-completed problem was changed to an over-completed one. To reduce the number of predictors in logistic regression by removing irrelevant and mutually correlated entries, the elastic net method was used. The developed algorithm that reconstructs images pixel-by-pixel is insensitive to the shape, number and position of the reconstructed objects. In order to assess the quality of mappings obtained thanks to the new algorithm, appropriate metrics were used: compatibility ratio (CR) and relative error (RE). The obtained results enabled the assessment of the usefulness of logistic regression in the reconstruction of EIT and UST images. |
format | Online Article Text |
id | pubmed-6696525 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-66965252019-09-05 Logistic Regression for Machine Learning in Process Tomography Rymarczyk, Tomasz Kozłowski, Edward Kłosowski, Grzegorz Niderla, Konrad Sensors (Basel) Article The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasound transmission tomography (UST). The test object was a tank filled with water in which reconstructed objects were placed. For both EIT and UST, a novel approach was used in which each pixel of the output image was reconstructed by a separately trained prediction system. Therefore, it was necessary to use many predictive systems whose number corresponds to the number of pixels of the output image. Thanks to this approach the under-completed problem was changed to an over-completed one. To reduce the number of predictors in logistic regression by removing irrelevant and mutually correlated entries, the elastic net method was used. The developed algorithm that reconstructs images pixel-by-pixel is insensitive to the shape, number and position of the reconstructed objects. In order to assess the quality of mappings obtained thanks to the new algorithm, appropriate metrics were used: compatibility ratio (CR) and relative error (RE). The obtained results enabled the assessment of the usefulness of logistic regression in the reconstruction of EIT and UST images. MDPI 2019-08-02 /pmc/articles/PMC6696525/ /pubmed/31382513 http://dx.doi.org/10.3390/s19153400 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Rymarczyk, Tomasz Kozłowski, Edward Kłosowski, Grzegorz Niderla, Konrad Logistic Regression for Machine Learning in Process Tomography |
title | Logistic Regression for Machine Learning in Process Tomography |
title_full | Logistic Regression for Machine Learning in Process Tomography |
title_fullStr | Logistic Regression for Machine Learning in Process Tomography |
title_full_unstemmed | Logistic Regression for Machine Learning in Process Tomography |
title_short | Logistic Regression for Machine Learning in Process Tomography |
title_sort | logistic regression for machine learning in process tomography |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/ https://www.ncbi.nlm.nih.gov/pubmed/31382513 http://dx.doi.org/10.3390/s19153400 |
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