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Logistic Regression for Machine Learning in Process Tomography

The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasoun...

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Autores principales: Rymarczyk, Tomasz, Kozłowski, Edward, Kłosowski, Grzegorz, Niderla, Konrad
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/
https://www.ncbi.nlm.nih.gov/pubmed/31382513
http://dx.doi.org/10.3390/s19153400
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author Rymarczyk, Tomasz
Kozłowski, Edward
Kłosowski, Grzegorz
Niderla, Konrad
author_facet Rymarczyk, Tomasz
Kozłowski, Edward
Kłosowski, Grzegorz
Niderla, Konrad
author_sort Rymarczyk, Tomasz
collection PubMed
description The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasound transmission tomography (UST). The test object was a tank filled with water in which reconstructed objects were placed. For both EIT and UST, a novel approach was used in which each pixel of the output image was reconstructed by a separately trained prediction system. Therefore, it was necessary to use many predictive systems whose number corresponds to the number of pixels of the output image. Thanks to this approach the under-completed problem was changed to an over-completed one. To reduce the number of predictors in logistic regression by removing irrelevant and mutually correlated entries, the elastic net method was used. The developed algorithm that reconstructs images pixel-by-pixel is insensitive to the shape, number and position of the reconstructed objects. In order to assess the quality of mappings obtained thanks to the new algorithm, appropriate metrics were used: compatibility ratio (CR) and relative error (RE). The obtained results enabled the assessment of the usefulness of logistic regression in the reconstruction of EIT and UST images.
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spelling pubmed-66965252019-09-05 Logistic Regression for Machine Learning in Process Tomography Rymarczyk, Tomasz Kozłowski, Edward Kłosowski, Grzegorz Niderla, Konrad Sensors (Basel) Article The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasound transmission tomography (UST). The test object was a tank filled with water in which reconstructed objects were placed. For both EIT and UST, a novel approach was used in which each pixel of the output image was reconstructed by a separately trained prediction system. Therefore, it was necessary to use many predictive systems whose number corresponds to the number of pixels of the output image. Thanks to this approach the under-completed problem was changed to an over-completed one. To reduce the number of predictors in logistic regression by removing irrelevant and mutually correlated entries, the elastic net method was used. The developed algorithm that reconstructs images pixel-by-pixel is insensitive to the shape, number and position of the reconstructed objects. In order to assess the quality of mappings obtained thanks to the new algorithm, appropriate metrics were used: compatibility ratio (CR) and relative error (RE). The obtained results enabled the assessment of the usefulness of logistic regression in the reconstruction of EIT and UST images. MDPI 2019-08-02 /pmc/articles/PMC6696525/ /pubmed/31382513 http://dx.doi.org/10.3390/s19153400 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Rymarczyk, Tomasz
Kozłowski, Edward
Kłosowski, Grzegorz
Niderla, Konrad
Logistic Regression for Machine Learning in Process Tomography
title Logistic Regression for Machine Learning in Process Tomography
title_full Logistic Regression for Machine Learning in Process Tomography
title_fullStr Logistic Regression for Machine Learning in Process Tomography
title_full_unstemmed Logistic Regression for Machine Learning in Process Tomography
title_short Logistic Regression for Machine Learning in Process Tomography
title_sort logistic regression for machine learning in process tomography
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/
https://www.ncbi.nlm.nih.gov/pubmed/31382513
http://dx.doi.org/10.3390/s19153400
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