Logistic Regression for Machine Learning in Process Tomography

The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasoun...

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Detalles Bibliográficos
Autores principales: Rymarczyk, Tomasz, Kozłowski, Edward, Kłosowski, Grzegorz, Niderla, Konrad
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/
https://www.ncbi.nlm.nih.gov/pubmed/31382513
http://dx.doi.org/10.3390/s19153400

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/
https://www.ncbi.nlm.nih.gov/pubmed/31382513
http://dx.doi.org/10.3390/s19153400

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