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Logistic Regression for Machine Learning in Process Tomography
The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasoun...
Autores principales: | Rymarczyk, Tomasz, Kozłowski, Edward, Kłosowski, Grzegorz, Niderla, Konrad |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6696525/ https://www.ncbi.nlm.nih.gov/pubmed/31382513 http://dx.doi.org/10.3390/s19153400 |
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