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Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer
This paper provides a new method to compare and then reveal the vacancy sink efficiencies quantitively between different hetero-interfaces with a shared Cu layer in one sample, in contrast to previous studies, which have compared the vacancy sink efficiencies of interfaces in different samples. Cu-N...
Autores principales: | , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6720210/ https://www.ncbi.nlm.nih.gov/pubmed/31426589 http://dx.doi.org/10.3390/ma12162628 |
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author | Chen, Huaqiang Du, Jinlong Liang, Yanxia Wang, Peipei Huang, Jinchi Zhang, Jian Zhao, Yunbiao Wang, Xingjun Zhang, Xianfeng Wang, Yuehui Stanciu, George A. Fu, Engang |
author_facet | Chen, Huaqiang Du, Jinlong Liang, Yanxia Wang, Peipei Huang, Jinchi Zhang, Jian Zhao, Yunbiao Wang, Xingjun Zhang, Xianfeng Wang, Yuehui Stanciu, George A. Fu, Engang |
author_sort | Chen, Huaqiang |
collection | PubMed |
description | This paper provides a new method to compare and then reveal the vacancy sink efficiencies quantitively between different hetero-interfaces with a shared Cu layer in one sample, in contrast to previous studies, which have compared the vacancy sink efficiencies of interfaces in different samples. Cu-Nb-Cu-V nanoscale metallic multilayer composites (NMMCs) containing Cu/V and Cu/Nb interfaces periodically were prepared as research samples and bombarded with helium ions to create vacancies which were filled by helium bubbles. A special Cu layer shared by adjoining Cu/V and Cu/Nb interfaces exists, in which the implanted helium concentration reaches its maximum and remains nearly constant with a well-designed incident energy. The results show that bubble-denuded zones (BDZ) close to interfaces exist, and that the width of the BDZ close to the Cu/V interface is less than that of Cu/Nb interface. This result is explained by one-dimensional diffusion theory, and the ratio of vacancy sink efficiency between Cu/V and Cu/Nb interfaces is calculated. Conclusively, Cu/Nb interfaces are more efficient than Cu/V interfaces in eliminating vacancies induced by radiation. |
format | Online Article Text |
id | pubmed-6720210 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-67202102019-10-30 Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer Chen, Huaqiang Du, Jinlong Liang, Yanxia Wang, Peipei Huang, Jinchi Zhang, Jian Zhao, Yunbiao Wang, Xingjun Zhang, Xianfeng Wang, Yuehui Stanciu, George A. Fu, Engang Materials (Basel) Letter This paper provides a new method to compare and then reveal the vacancy sink efficiencies quantitively between different hetero-interfaces with a shared Cu layer in one sample, in contrast to previous studies, which have compared the vacancy sink efficiencies of interfaces in different samples. Cu-Nb-Cu-V nanoscale metallic multilayer composites (NMMCs) containing Cu/V and Cu/Nb interfaces periodically were prepared as research samples and bombarded with helium ions to create vacancies which were filled by helium bubbles. A special Cu layer shared by adjoining Cu/V and Cu/Nb interfaces exists, in which the implanted helium concentration reaches its maximum and remains nearly constant with a well-designed incident energy. The results show that bubble-denuded zones (BDZ) close to interfaces exist, and that the width of the BDZ close to the Cu/V interface is less than that of Cu/Nb interface. This result is explained by one-dimensional diffusion theory, and the ratio of vacancy sink efficiency between Cu/V and Cu/Nb interfaces is calculated. Conclusively, Cu/Nb interfaces are more efficient than Cu/V interfaces in eliminating vacancies induced by radiation. MDPI 2019-08-18 /pmc/articles/PMC6720210/ /pubmed/31426589 http://dx.doi.org/10.3390/ma12162628 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Letter Chen, Huaqiang Du, Jinlong Liang, Yanxia Wang, Peipei Huang, Jinchi Zhang, Jian Zhao, Yunbiao Wang, Xingjun Zhang, Xianfeng Wang, Yuehui Stanciu, George A. Fu, Engang Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer |
title | Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer |
title_full | Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer |
title_fullStr | Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer |
title_full_unstemmed | Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer |
title_short | Comparison of Vacancy Sink Efficiency of Cu/V and Cu/Nb Interfaces by the Shared Cu Layer |
title_sort | comparison of vacancy sink efficiency of cu/v and cu/nb interfaces by the shared cu layer |
topic | Letter |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6720210/ https://www.ncbi.nlm.nih.gov/pubmed/31426589 http://dx.doi.org/10.3390/ma12162628 |
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