Substrate Temperature Dependent Microstructure and Electron-Induced Secondary Electron Emission Properties of Magnetron Sputter-Deposited Amorphous Carbon Films

For special instruments or equipments including particle accelerators, space microwave devices and spacecrafts, the suppression for electron-induced secondary electron emission (SEE) occurring on the component surfaces is of great significance due to a negative influence caused by SEE on their norma...

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Detalles Bibliográficos
Autores principales: Li, Jie, Yi, Xingkang, Hu, Wenbo, Gao, Buyu, Li, Yongdong, Wu, Shengli, Lin, Shu, Zhang, Jintao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6720795/
https://www.ncbi.nlm.nih.gov/pubmed/31430848
http://dx.doi.org/10.3390/ma12162631

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6720795/
https://www.ncbi.nlm.nih.gov/pubmed/31430848
http://dx.doi.org/10.3390/ma12162631

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