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Contact Photolithography at Sub-Micrometer Scale Using a Soft Photomask

This paper proposes a method for improving the patterning resolution of conventional contact photolithography from the micrometer, down to the sub-micrometer scale. The key element is a soft polydimethylsiloxane (PDMS) photomask, which is first replicated from a silicon mold and then patterned with...

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Detalles Bibliográficos
Autores principales: Wu, Chun-Ying, Hsieh, Heng, Lee, Yung-Chun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6723422/
https://www.ncbi.nlm.nih.gov/pubmed/31426559
http://dx.doi.org/10.3390/mi10080547