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Contact Photolithography at Sub-Micrometer Scale Using a Soft Photomask
This paper proposes a method for improving the patterning resolution of conventional contact photolithography from the micrometer, down to the sub-micrometer scale. The key element is a soft polydimethylsiloxane (PDMS) photomask, which is first replicated from a silicon mold and then patterned with...
Autores principales: | Wu, Chun-Ying, Hsieh, Heng, Lee, Yung-Chun |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6723422/ https://www.ncbi.nlm.nih.gov/pubmed/31426559 http://dx.doi.org/10.3390/mi10080547 |
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