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Reliability issues of lead-free solder joints in electronic devices

Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process,...

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Detalles Bibliográficos
Autores principales: Jiang, Nan, Zhang, Liang, Liu, Zhi-Quan, Sun, Lei, Long, Wei-Min, He, Peng, Xiong, Ming-Yue, Zhao, Meng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6735330/
https://www.ncbi.nlm.nih.gov/pubmed/31528239
http://dx.doi.org/10.1080/14686996.2019.1640072
_version_ 1783450335136710656
author Jiang, Nan
Zhang, Liang
Liu, Zhi-Quan
Sun, Lei
Long, Wei-Min
He, Peng
Xiong, Ming-Yue
Zhao, Meng
author_facet Jiang, Nan
Zhang, Liang
Liu, Zhi-Quan
Sun, Lei
Long, Wei-Min
He, Peng
Xiong, Ming-Yue
Zhao, Meng
author_sort Jiang, Nan
collection PubMed
description Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process, mostly due to the failure of solder joints. With the improvement of environmental protection awareness, lead-free solder joints have become a hot issue in recent years. This paper reviews the research progress on the reliability of lead-free solder joints and discusses the influence of temperature, vibration, tin whisker and electromigration on the reliability of solder joints. In addition, the measures to improve the reliability of solder joints are analyzed according to the problems of solder joints themselves, which provides a further theoretical basis for the study of the reliability of solder joints of electronic products in service.
format Online
Article
Text
id pubmed-6735330
institution National Center for Biotechnology Information
language English
publishDate 2019
publisher Taylor & Francis
record_format MEDLINE/PubMed
spelling pubmed-67353302019-09-16 Reliability issues of lead-free solder joints in electronic devices Jiang, Nan Zhang, Liang Liu, Zhi-Quan Sun, Lei Long, Wei-Min He, Peng Xiong, Ming-Yue Zhao, Meng Sci Technol Adv Mater Optical, Magnetic and Electronic Device Materials Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process, mostly due to the failure of solder joints. With the improvement of environmental protection awareness, lead-free solder joints have become a hot issue in recent years. This paper reviews the research progress on the reliability of lead-free solder joints and discusses the influence of temperature, vibration, tin whisker and electromigration on the reliability of solder joints. In addition, the measures to improve the reliability of solder joints are analyzed according to the problems of solder joints themselves, which provides a further theoretical basis for the study of the reliability of solder joints of electronic products in service. Taylor & Francis 2019-07-11 /pmc/articles/PMC6735330/ /pubmed/31528239 http://dx.doi.org/10.1080/14686996.2019.1640072 Text en © 2019 The Author(s). Published by National Institute for Materials Science in partnership with Informa UK Limited, trading as Taylor & Francis Group. http://creativecommons.org/licenses/by/4.0/ This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Optical, Magnetic and Electronic Device Materials
Jiang, Nan
Zhang, Liang
Liu, Zhi-Quan
Sun, Lei
Long, Wei-Min
He, Peng
Xiong, Ming-Yue
Zhao, Meng
Reliability issues of lead-free solder joints in electronic devices
title Reliability issues of lead-free solder joints in electronic devices
title_full Reliability issues of lead-free solder joints in electronic devices
title_fullStr Reliability issues of lead-free solder joints in electronic devices
title_full_unstemmed Reliability issues of lead-free solder joints in electronic devices
title_short Reliability issues of lead-free solder joints in electronic devices
title_sort reliability issues of lead-free solder joints in electronic devices
topic Optical, Magnetic and Electronic Device Materials
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6735330/
https://www.ncbi.nlm.nih.gov/pubmed/31528239
http://dx.doi.org/10.1080/14686996.2019.1640072
work_keys_str_mv AT jiangnan reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT zhangliang reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT liuzhiquan reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT sunlei reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT longweimin reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT hepeng reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT xiongmingyue reliabilityissuesofleadfreesolderjointsinelectronicdevices
AT zhaomeng reliabilityissuesofleadfreesolderjointsinelectronicdevices