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Reliability issues of lead-free solder joints in electronic devices
Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process,...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6735330/ https://www.ncbi.nlm.nih.gov/pubmed/31528239 http://dx.doi.org/10.1080/14686996.2019.1640072 |
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author | Jiang, Nan Zhang, Liang Liu, Zhi-Quan Sun, Lei Long, Wei-Min He, Peng Xiong, Ming-Yue Zhao, Meng |
author_facet | Jiang, Nan Zhang, Liang Liu, Zhi-Quan Sun, Lei Long, Wei-Min He, Peng Xiong, Ming-Yue Zhao, Meng |
author_sort | Jiang, Nan |
collection | PubMed |
description | Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process, mostly due to the failure of solder joints. With the improvement of environmental protection awareness, lead-free solder joints have become a hot issue in recent years. This paper reviews the research progress on the reliability of lead-free solder joints and discusses the influence of temperature, vibration, tin whisker and electromigration on the reliability of solder joints. In addition, the measures to improve the reliability of solder joints are analyzed according to the problems of solder joints themselves, which provides a further theoretical basis for the study of the reliability of solder joints of electronic products in service. |
format | Online Article Text |
id | pubmed-6735330 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | Taylor & Francis |
record_format | MEDLINE/PubMed |
spelling | pubmed-67353302019-09-16 Reliability issues of lead-free solder joints in electronic devices Jiang, Nan Zhang, Liang Liu, Zhi-Quan Sun, Lei Long, Wei-Min He, Peng Xiong, Ming-Yue Zhao, Meng Sci Technol Adv Mater Optical, Magnetic and Electronic Device Materials Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process, mostly due to the failure of solder joints. With the improvement of environmental protection awareness, lead-free solder joints have become a hot issue in recent years. This paper reviews the research progress on the reliability of lead-free solder joints and discusses the influence of temperature, vibration, tin whisker and electromigration on the reliability of solder joints. In addition, the measures to improve the reliability of solder joints are analyzed according to the problems of solder joints themselves, which provides a further theoretical basis for the study of the reliability of solder joints of electronic products in service. Taylor & Francis 2019-07-11 /pmc/articles/PMC6735330/ /pubmed/31528239 http://dx.doi.org/10.1080/14686996.2019.1640072 Text en © 2019 The Author(s). Published by National Institute for Materials Science in partnership with Informa UK Limited, trading as Taylor & Francis Group. http://creativecommons.org/licenses/by/4.0/ This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Optical, Magnetic and Electronic Device Materials Jiang, Nan Zhang, Liang Liu, Zhi-Quan Sun, Lei Long, Wei-Min He, Peng Xiong, Ming-Yue Zhao, Meng Reliability issues of lead-free solder joints in electronic devices |
title | Reliability issues of lead-free solder joints in electronic devices |
title_full | Reliability issues of lead-free solder joints in electronic devices |
title_fullStr | Reliability issues of lead-free solder joints in electronic devices |
title_full_unstemmed | Reliability issues of lead-free solder joints in electronic devices |
title_short | Reliability issues of lead-free solder joints in electronic devices |
title_sort | reliability issues of lead-free solder joints in electronic devices |
topic | Optical, Magnetic and Electronic Device Materials |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6735330/ https://www.ncbi.nlm.nih.gov/pubmed/31528239 http://dx.doi.org/10.1080/14686996.2019.1640072 |
work_keys_str_mv | AT jiangnan reliabilityissuesofleadfreesolderjointsinelectronicdevices AT zhangliang reliabilityissuesofleadfreesolderjointsinelectronicdevices AT liuzhiquan reliabilityissuesofleadfreesolderjointsinelectronicdevices AT sunlei reliabilityissuesofleadfreesolderjointsinelectronicdevices AT longweimin reliabilityissuesofleadfreesolderjointsinelectronicdevices AT hepeng reliabilityissuesofleadfreesolderjointsinelectronicdevices AT xiongmingyue reliabilityissuesofleadfreesolderjointsinelectronicdevices AT zhaomeng reliabilityissuesofleadfreesolderjointsinelectronicdevices |