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Polymer Patterning with Self-Heating Atomic Force Microscope Probes

[Image: see text] Scanning probe-assisted patterning methods already demonstrated a high degree of capabilities on submicrometer scales. However, the throughput is still far from its potential because of complexity or fragility of the probes for exploiting thermal effects, chemical reactions, and vo...

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Autores principales: Ciftci, H. Tunc, Van, Laurent Pham, Koopmans, Bert, Kurnosikov, Oleg
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2019
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6755611/
https://www.ncbi.nlm.nih.gov/pubmed/31411884
http://dx.doi.org/10.1021/acs.jpca.9b06056
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author Ciftci, H. Tunc
Van, Laurent Pham
Koopmans, Bert
Kurnosikov, Oleg
author_facet Ciftci, H. Tunc
Van, Laurent Pham
Koopmans, Bert
Kurnosikov, Oleg
author_sort Ciftci, H. Tunc
collection PubMed
description [Image: see text] Scanning probe-assisted patterning methods already demonstrated a high degree of capabilities on submicrometer scales. However, the throughput is still far from its potential because of complexity or fragility of the probes for exploiting thermal effects, chemical reactions, and voltage-induced processes in various patterning operations. Here, we present a new approach to thermomechanical patterning by implementing a multitasking atomic force microscopy (AFM) probe: the functionalized planar probes. In this method, we can generate a tunable thermal gradient between the tip and the sample, wherein they remain in the noncontact regime. In principle, the capillary instability provoked by the van der Waals interaction yields a pull-off force toward the tip. Hence, locally rising protrusions form features at any selected position on a polymer surface without any chemical reaction or irreversible transformation. These multitasking probe-integrated AFMs can pave the way for a remarkable freedom in determining the operation regime on submicrometer surface-patterning applications.
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spelling pubmed-67556112019-09-24 Polymer Patterning with Self-Heating Atomic Force Microscope Probes Ciftci, H. Tunc Van, Laurent Pham Koopmans, Bert Kurnosikov, Oleg J Phys Chem A [Image: see text] Scanning probe-assisted patterning methods already demonstrated a high degree of capabilities on submicrometer scales. However, the throughput is still far from its potential because of complexity or fragility of the probes for exploiting thermal effects, chemical reactions, and voltage-induced processes in various patterning operations. Here, we present a new approach to thermomechanical patterning by implementing a multitasking atomic force microscopy (AFM) probe: the functionalized planar probes. In this method, we can generate a tunable thermal gradient between the tip and the sample, wherein they remain in the noncontact regime. In principle, the capillary instability provoked by the van der Waals interaction yields a pull-off force toward the tip. Hence, locally rising protrusions form features at any selected position on a polymer surface without any chemical reaction or irreversible transformation. These multitasking probe-integrated AFMs can pave the way for a remarkable freedom in determining the operation regime on submicrometer surface-patterning applications. American Chemical Society 2019-08-14 2019-09-19 /pmc/articles/PMC6755611/ /pubmed/31411884 http://dx.doi.org/10.1021/acs.jpca.9b06056 Text en Copyright © 2019 American Chemical Society This is an open access article published under a Creative Commons Non-Commercial No Derivative Works (CC-BY-NC-ND) Attribution License (http://pubs.acs.org/page/policy/authorchoice_ccbyncnd_termsofuse.html) , which permits copying and redistribution of the article, and creation of adaptations, all for non-commercial purposes.
spellingShingle Ciftci, H. Tunc
Van, Laurent Pham
Koopmans, Bert
Kurnosikov, Oleg
Polymer Patterning with Self-Heating Atomic Force Microscope Probes
title Polymer Patterning with Self-Heating Atomic Force Microscope Probes
title_full Polymer Patterning with Self-Heating Atomic Force Microscope Probes
title_fullStr Polymer Patterning with Self-Heating Atomic Force Microscope Probes
title_full_unstemmed Polymer Patterning with Self-Heating Atomic Force Microscope Probes
title_short Polymer Patterning with Self-Heating Atomic Force Microscope Probes
title_sort polymer patterning with self-heating atomic force microscope probes
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6755611/
https://www.ncbi.nlm.nih.gov/pubmed/31411884
http://dx.doi.org/10.1021/acs.jpca.9b06056
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