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Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses
Cr/V multilayer mirrors are suitable for applications in the “water window” spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses varying from 0.6 nm to 4.0 nm, and a fixed thickness (1.3 nm) of chromium...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6766248/ https://www.ncbi.nlm.nih.gov/pubmed/31514331 http://dx.doi.org/10.3390/ma12182936 |
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author | Qi, Runze Huang, Qiushi Fei, Jiani Kozhevnikov, Igor V. Liu, Yang Li, Pin Zhang, Zhong Wang, Zhanshan |
author_facet | Qi, Runze Huang, Qiushi Fei, Jiani Kozhevnikov, Igor V. Liu, Yang Li, Pin Zhang, Zhong Wang, Zhanshan |
author_sort | Qi, Runze |
collection | PubMed |
description | Cr/V multilayer mirrors are suitable for applications in the “water window” spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses varying from 0.6 nm to 4.0 nm, and a fixed thickness (1.3 nm) of chromium layers, were fabricated and characterized with a set of experimental techniques. The average interface width characterizing a cumulative effect of different structure irregularities was demonstrated to exhibit non-monotonous dependence on the V layer thickness and achieve a minimal value of 0.31 nm when the thickness of the V layers was 1.2 nm. The discontinuous growth of very thin V films increased in roughness as the thickness of V layers decreased. The columnar growth of the polycrystalline grains in both materials became more pronounced with increasing thickness, resulting in a continuous increase in the interface width to a maximum of 0.9 nm for a 4 nm thickness of the V layer. |
format | Online Article Text |
id | pubmed-6766248 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-67662482019-09-30 Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses Qi, Runze Huang, Qiushi Fei, Jiani Kozhevnikov, Igor V. Liu, Yang Li, Pin Zhang, Zhong Wang, Zhanshan Materials (Basel) Article Cr/V multilayer mirrors are suitable for applications in the “water window” spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses varying from 0.6 nm to 4.0 nm, and a fixed thickness (1.3 nm) of chromium layers, were fabricated and characterized with a set of experimental techniques. The average interface width characterizing a cumulative effect of different structure irregularities was demonstrated to exhibit non-monotonous dependence on the V layer thickness and achieve a minimal value of 0.31 nm when the thickness of the V layers was 1.2 nm. The discontinuous growth of very thin V films increased in roughness as the thickness of V layers decreased. The columnar growth of the polycrystalline grains in both materials became more pronounced with increasing thickness, resulting in a continuous increase in the interface width to a maximum of 0.9 nm for a 4 nm thickness of the V layer. MDPI 2019-09-11 /pmc/articles/PMC6766248/ /pubmed/31514331 http://dx.doi.org/10.3390/ma12182936 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Qi, Runze Huang, Qiushi Fei, Jiani Kozhevnikov, Igor V. Liu, Yang Li, Pin Zhang, Zhong Wang, Zhanshan Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses |
title | Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses |
title_full | Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses |
title_fullStr | Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses |
title_full_unstemmed | Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses |
title_short | Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses |
title_sort | evolution of the internal structure of short-period cr/v multilayers with different vanadium layers thicknesses |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6766248/ https://www.ncbi.nlm.nih.gov/pubmed/31514331 http://dx.doi.org/10.3390/ma12182936 |
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