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Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications
Cuprous oxide (Cu(2)O) is a p-type semiconductor with high optical absorption and a direct bandgap of about 2.1 eV, making it an attractive material for photovoltaic applications. For a high-performance photovoltaic device, the formation of low-resistivity contacts on Cu(2)O thin films is a prerequi...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6766308/ https://www.ncbi.nlm.nih.gov/pubmed/31546778 http://dx.doi.org/10.3390/ma12183038 |
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author | Nordseth, Ørnulf Kumar, Raj Bergum, Kristin Chilibon, Irinela Foss, Sean Erik Monakhov, Edouard |
author_facet | Nordseth, Ørnulf Kumar, Raj Bergum, Kristin Chilibon, Irinela Foss, Sean Erik Monakhov, Edouard |
author_sort | Nordseth, Ørnulf |
collection | PubMed |
description | Cuprous oxide (Cu(2)O) is a p-type semiconductor with high optical absorption and a direct bandgap of about 2.1 eV, making it an attractive material for photovoltaic applications. For a high-performance photovoltaic device, the formation of low-resistivity contacts on Cu(2)O thin films is a prerequisite, which can be achieved by, for instance, nitrogen doping of Cu(2)O in order to increase the carrier concentration. In this work, nitrogen-doped p-type Cu(2)O thin films were prepared on quartz substrates by magnetron sputter deposition. By adding N(2) gas during the deposition process, a nitrogen concentration of up to 2.3 × 10(21) atoms/cm(3) in the Cu(2)O thin films was achieved, as determined from secondary ion mass spectroscopy measurements. The effect of nitrogen doping on the structural, optical, and electrical properties of the Cu(2)O thin films was investigated. X-ray diffraction measurements suggest a preservation of the Cu(2)O phase for the nitrogen doped thin films, whereas spectrophotometric measurements show that the optical properties were not significantly altered by incorporation of nitrogen into the Cu(2)O matrix. A significant conductivity enhancement was achieved for the nitrogen-doped Cu(2)O thin films, based on Hall effect measurements, i.e., the hole concentration was increased from 4 × 10(15) to 3 × 10(19) cm(−3) and the resistivity was reduced from 190 to 1.9 Ω⋅cm by adding nitrogen to the Cu(2)O thin films. |
format | Online Article Text |
id | pubmed-6766308 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-67663082019-09-30 Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications Nordseth, Ørnulf Kumar, Raj Bergum, Kristin Chilibon, Irinela Foss, Sean Erik Monakhov, Edouard Materials (Basel) Article Cuprous oxide (Cu(2)O) is a p-type semiconductor with high optical absorption and a direct bandgap of about 2.1 eV, making it an attractive material for photovoltaic applications. For a high-performance photovoltaic device, the formation of low-resistivity contacts on Cu(2)O thin films is a prerequisite, which can be achieved by, for instance, nitrogen doping of Cu(2)O in order to increase the carrier concentration. In this work, nitrogen-doped p-type Cu(2)O thin films were prepared on quartz substrates by magnetron sputter deposition. By adding N(2) gas during the deposition process, a nitrogen concentration of up to 2.3 × 10(21) atoms/cm(3) in the Cu(2)O thin films was achieved, as determined from secondary ion mass spectroscopy measurements. The effect of nitrogen doping on the structural, optical, and electrical properties of the Cu(2)O thin films was investigated. X-ray diffraction measurements suggest a preservation of the Cu(2)O phase for the nitrogen doped thin films, whereas spectrophotometric measurements show that the optical properties were not significantly altered by incorporation of nitrogen into the Cu(2)O matrix. A significant conductivity enhancement was achieved for the nitrogen-doped Cu(2)O thin films, based on Hall effect measurements, i.e., the hole concentration was increased from 4 × 10(15) to 3 × 10(19) cm(−3) and the resistivity was reduced from 190 to 1.9 Ω⋅cm by adding nitrogen to the Cu(2)O thin films. MDPI 2019-09-19 /pmc/articles/PMC6766308/ /pubmed/31546778 http://dx.doi.org/10.3390/ma12183038 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Nordseth, Ørnulf Kumar, Raj Bergum, Kristin Chilibon, Irinela Foss, Sean Erik Monakhov, Edouard Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications |
title | Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications |
title_full | Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications |
title_fullStr | Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications |
title_full_unstemmed | Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications |
title_short | Nitrogen-Doped Cu(2)O Thin Films for Photovoltaic Applications |
title_sort | nitrogen-doped cu(2)o thin films for photovoltaic applications |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6766308/ https://www.ncbi.nlm.nih.gov/pubmed/31546778 http://dx.doi.org/10.3390/ma12183038 |
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