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A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film samples thinner than a few hundreds of micrometers and is sometimes even impossible. The temporal resolution of time-doma...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6806189/ https://www.ncbi.nlm.nih.gov/pubmed/31547626 http://dx.doi.org/10.3390/s19194118 |