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Calibration of Displacement Laser Interferometer Systems for Industrial Metrology
Displacement laser interferometer systems are widely used for the calibration of machine tools and CMMs (Coordinate Measuring Machines). Additionally, they are often the workhorse in dimensional calibration laboratories, where they act as the basic metrological traceability link for many calibration...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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MDPI
2019
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6806270/ https://www.ncbi.nlm.nih.gov/pubmed/31546748 http://dx.doi.org/10.3390/s19194100 |
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author | Haitjema, Han |
author_facet | Haitjema, Han |
author_sort | Haitjema, Han |
collection | PubMed |
description | Displacement laser interferometer systems are widely used for the calibration of machine tools and CMMs (Coordinate Measuring Machines). Additionally, they are often the workhorse in dimensional calibration laboratories, where they act as the basic metrological traceability link for many calibrations. This paper gives a review of the calibration of such systems, where several approaches, such as the calibrations of separate components or the system as a whole, are reviewed. The calibrations discussed are: the laser frequency, the counting system, software evaluation of the environmental conditions, environmental and material temperature sensor calibration and the calibration of optics that is part of the system. For these calibrations considerations are given about the ways these can be carried out and about establishing the re-calibration intervals. |
format | Online Article Text |
id | pubmed-6806270 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-68062702019-11-07 Calibration of Displacement Laser Interferometer Systems for Industrial Metrology Haitjema, Han Sensors (Basel) Review Displacement laser interferometer systems are widely used for the calibration of machine tools and CMMs (Coordinate Measuring Machines). Additionally, they are often the workhorse in dimensional calibration laboratories, where they act as the basic metrological traceability link for many calibrations. This paper gives a review of the calibration of such systems, where several approaches, such as the calibrations of separate components or the system as a whole, are reviewed. The calibrations discussed are: the laser frequency, the counting system, software evaluation of the environmental conditions, environmental and material temperature sensor calibration and the calibration of optics that is part of the system. For these calibrations considerations are given about the ways these can be carried out and about establishing the re-calibration intervals. MDPI 2019-09-22 /pmc/articles/PMC6806270/ /pubmed/31546748 http://dx.doi.org/10.3390/s19194100 Text en © 2019 by the author. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Review Haitjema, Han Calibration of Displacement Laser Interferometer Systems for Industrial Metrology |
title | Calibration of Displacement Laser Interferometer Systems for Industrial Metrology |
title_full | Calibration of Displacement Laser Interferometer Systems for Industrial Metrology |
title_fullStr | Calibration of Displacement Laser Interferometer Systems for Industrial Metrology |
title_full_unstemmed | Calibration of Displacement Laser Interferometer Systems for Industrial Metrology |
title_short | Calibration of Displacement Laser Interferometer Systems for Industrial Metrology |
title_sort | calibration of displacement laser interferometer systems for industrial metrology |
topic | Review |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6806270/ https://www.ncbi.nlm.nih.gov/pubmed/31546748 http://dx.doi.org/10.3390/s19194100 |
work_keys_str_mv | AT haitjemahan calibrationofdisplacementlaserinterferometersystemsforindustrialmetrology |