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Single-crystalline boron-doped diamond superconducting quantum interference devices with regrowth-induced step edge structure

Superconducting quantum interference devices (SQUIDs) are currently used as magnetic flux detectors with ultra-high sensitivity for various applications such as medical diagnostics and magnetic material microstructure analysis. Single-crystalline superconducting boron-doped diamond is an excellent c...

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Detalles Bibliográficos
Autores principales: Kageura, Taisuke, Hideko, Masakuni, Tsuyuzaki, Ikuto, Morishita, Aoi, Kawano, Akihiro, Sasama, Yosuke, Yamaguchi, Takahide, Takano, Yoshihiko, Tachiki, Minoru, Ooi, Shuuichi, Hirata, Kazuto, Arisawa, Shunichi, Kawarada, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6811626/
https://www.ncbi.nlm.nih.gov/pubmed/31645621
http://dx.doi.org/10.1038/s41598-019-51596-w
Descripción
Sumario:Superconducting quantum interference devices (SQUIDs) are currently used as magnetic flux detectors with ultra-high sensitivity for various applications such as medical diagnostics and magnetic material microstructure analysis. Single-crystalline superconducting boron-doped diamond is an excellent candidate for fabricating high-performance SQUIDs because of its robustness and high transition temperature, critical current density, and critical field. Here, we propose a fabrication process for a single-crystalline boron-doped diamond Josephson junction with regrowth-induced step edge structure and demonstrate the first operation of a single-crystalline boron-doped diamond SQUID above 2 K. We demonstrate that the step angle is a significant parameter for forming the Josephson junction and that the step angle can be controlled by adjusting the microwave plasma-enhanced chemical vapour deposition conditions of the regrowth layer. The fabricated junction exhibits superconductor–weak superconductor–superconductor-type behaviour without hysteresis and a high critical current density of 5800 A/cm(2).