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Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects

Red-kinked current-voltage characteristics in silver nanowire transparent electrode based Cu(In,Ga)Se(2) solar cells have been reported [1–3]. The author has recently revealed that the buffer/window interfacial defects cause the generation of red-kinked current-voltage characteristics in the solar c...

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Autor principal: Chung, Choong-Heui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6811924/
https://www.ncbi.nlm.nih.gov/pubmed/31667266
http://dx.doi.org/10.1016/j.dib.2019.104503
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author Chung, Choong-Heui
author_facet Chung, Choong-Heui
author_sort Chung, Choong-Heui
collection PubMed
description Red-kinked current-voltage characteristics in silver nanowire transparent electrode based Cu(In,Ga)Se(2) solar cells have been reported [1–3]. The author has recently revealed that the buffer/window interfacial defects cause the generation of red-kinked current-voltage characteristics in the solar cells [1]. This article provides the dataset regarding the red-kink for Cu(In,Ga)Se(2) solar cells as a function of the donor density in n-type window and CdS buffer/window interfacial defect density. The data were obtained by the simulation for Cu(In,Ga)Se(2) solar cells using SCAPS-1D. The data include current density-voltage curves, fill factor, open-circuit voltage, short-circuit current density, and efficiency in the solar cells, and energy band bending in the Cu(In,Ga)Se(2) layer.
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spelling pubmed-68119242019-10-30 Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects Chung, Choong-Heui Data Brief Engineering Red-kinked current-voltage characteristics in silver nanowire transparent electrode based Cu(In,Ga)Se(2) solar cells have been reported [1–3]. The author has recently revealed that the buffer/window interfacial defects cause the generation of red-kinked current-voltage characteristics in the solar cells [1]. This article provides the dataset regarding the red-kink for Cu(In,Ga)Se(2) solar cells as a function of the donor density in n-type window and CdS buffer/window interfacial defect density. The data were obtained by the simulation for Cu(In,Ga)Se(2) solar cells using SCAPS-1D. The data include current density-voltage curves, fill factor, open-circuit voltage, short-circuit current density, and efficiency in the solar cells, and energy band bending in the Cu(In,Ga)Se(2) layer. Elsevier 2019-09-12 /pmc/articles/PMC6811924/ /pubmed/31667266 http://dx.doi.org/10.1016/j.dib.2019.104503 Text en © 2019 The Author(s) http://creativecommons.org/licenses/by/4.0/ This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Engineering
Chung, Choong-Heui
Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects
title Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects
title_full Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects
title_fullStr Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects
title_full_unstemmed Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects
title_short Dataset on the generation of red-kinked current-voltage curves in Cu(In,Ga)Se(2) solar cells due to buffer/window interfacial defects
title_sort dataset on the generation of red-kinked current-voltage curves in cu(in,ga)se(2) solar cells due to buffer/window interfacial defects
topic Engineering
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6811924/
https://www.ncbi.nlm.nih.gov/pubmed/31667266
http://dx.doi.org/10.1016/j.dib.2019.104503
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