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High temporal resolution of leaf area data improves empirical estimation of grain yield

Empirical yield estimation from satellite data has long lacked suitable combinations of spatial and temporal resolutions. Consequently, the selection of metrics, i.e., temporal descriptors that predict grain yield, has likely been driven by practicality and data availability rather than by systemati...

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Autores principales: Waldner, François, Horan, Heidi, Chen, Yang, Hochman, Zvi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6823387/
https://www.ncbi.nlm.nih.gov/pubmed/31673050
http://dx.doi.org/10.1038/s41598-019-51715-7
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author Waldner, François
Horan, Heidi
Chen, Yang
Hochman, Zvi
author_facet Waldner, François
Horan, Heidi
Chen, Yang
Hochman, Zvi
author_sort Waldner, François
collection PubMed
description Empirical yield estimation from satellite data has long lacked suitable combinations of spatial and temporal resolutions. Consequently, the selection of metrics, i.e., temporal descriptors that predict grain yield, has likely been driven by practicality and data availability rather than by systematic targetting of critically sensitive periods as suggested by knowledge of crop physiology. The current trend towards hyper-temporal data raises two questions: How does temporality affect the accuracy of empirical models? Which metrics achieve optimal performance? We followed an in silico approach based on crop modelling which can generate any observation frequency, explore a range of growing conditions and reduce the cost of measuring yields in situ. We simulated wheat crops across Australia and regressed six types of metrics derived from the resulting time series of Leaf Area Index (LAI) against wheat yields. Empirical models using advanced LAI metrics achieved national relevance and, contrary to simple metrics, did not benefit from the addition of weather information. This suggests that they already integrate most climatic effects on yield. Simple metrics remained the best choice when LAI data are sparse. As we progress into a data-rich era, our results support a shift towards metrics that truly harness the temporal dimension of LAI data.
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spelling pubmed-68233872019-11-12 High temporal resolution of leaf area data improves empirical estimation of grain yield Waldner, François Horan, Heidi Chen, Yang Hochman, Zvi Sci Rep Article Empirical yield estimation from satellite data has long lacked suitable combinations of spatial and temporal resolutions. Consequently, the selection of metrics, i.e., temporal descriptors that predict grain yield, has likely been driven by practicality and data availability rather than by systematic targetting of critically sensitive periods as suggested by knowledge of crop physiology. The current trend towards hyper-temporal data raises two questions: How does temporality affect the accuracy of empirical models? Which metrics achieve optimal performance? We followed an in silico approach based on crop modelling which can generate any observation frequency, explore a range of growing conditions and reduce the cost of measuring yields in situ. We simulated wheat crops across Australia and regressed six types of metrics derived from the resulting time series of Leaf Area Index (LAI) against wheat yields. Empirical models using advanced LAI metrics achieved national relevance and, contrary to simple metrics, did not benefit from the addition of weather information. This suggests that they already integrate most climatic effects on yield. Simple metrics remained the best choice when LAI data are sparse. As we progress into a data-rich era, our results support a shift towards metrics that truly harness the temporal dimension of LAI data. Nature Publishing Group UK 2019-10-31 /pmc/articles/PMC6823387/ /pubmed/31673050 http://dx.doi.org/10.1038/s41598-019-51715-7 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Waldner, François
Horan, Heidi
Chen, Yang
Hochman, Zvi
High temporal resolution of leaf area data improves empirical estimation of grain yield
title High temporal resolution of leaf area data improves empirical estimation of grain yield
title_full High temporal resolution of leaf area data improves empirical estimation of grain yield
title_fullStr High temporal resolution of leaf area data improves empirical estimation of grain yield
title_full_unstemmed High temporal resolution of leaf area data improves empirical estimation of grain yield
title_short High temporal resolution of leaf area data improves empirical estimation of grain yield
title_sort high temporal resolution of leaf area data improves empirical estimation of grain yield
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6823387/
https://www.ncbi.nlm.nih.gov/pubmed/31673050
http://dx.doi.org/10.1038/s41598-019-51715-7
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