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Predicting strength distributions of MEMS structures using flaw size and spatial density
The populations of flaws in individual layers of microelectromechanical systems (MEMS) structures are determined and verified using a combination of specialized specimen geometry, recent probabilistic analysis, and topographic mapping. Strength distributions of notched and tensile bar specimens are...
Autores principales: | Cook, Robert F., DelRio, Frank W., Boyce, Brad L. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6826048/ https://www.ncbi.nlm.nih.gov/pubmed/31700670 http://dx.doi.org/10.1038/s41378-019-0093-y |
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