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3C-SiC Growth on Inverted Silicon Pyramids Patterned Substrate
This work reports on the properties of cubic silicon carbide (3C-SiC) grown epitaxially on a patterned silicon substrate composed of squared inverted silicon pyramids (ISP). This compliant substrate prevents stacking faults, usually found at the SiC/Si interface, from reaching the surface. We invest...
Autores principales: | Zimbone, Massimo, Zielinski, Marcin, Bongiorno, Corrado, Calabretta, Cristiano, Anzalone, Ruggero, Scalese, Silvia, Fisicaro, Giuseppe, La Magna, Antonino, Mancarella, Fulvio, La Via, Francesco |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6829442/ https://www.ncbi.nlm.nih.gov/pubmed/31635213 http://dx.doi.org/10.3390/ma12203407 |
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