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Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory

Memristor-based neuromorphic systems have been proposed as a promising alternative to von Neumann computing architectures, which are currently challenged by the ever-increasing computational power required by modern artificial intelligence (AI) algorithms. The design and optimization of memristive d...

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Autores principales: La Torraca, Paolo, Puglisi, Francesco Maria, Padovani, Andrea, Larcher, Luca
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6862055/
https://www.ncbi.nlm.nih.gov/pubmed/31652682
http://dx.doi.org/10.3390/ma12213461
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author La Torraca, Paolo
Puglisi, Francesco Maria
Padovani, Andrea
Larcher, Luca
author_facet La Torraca, Paolo
Puglisi, Francesco Maria
Padovani, Andrea
Larcher, Luca
author_sort La Torraca, Paolo
collection PubMed
description Memristor-based neuromorphic systems have been proposed as a promising alternative to von Neumann computing architectures, which are currently challenged by the ever-increasing computational power required by modern artificial intelligence (AI) algorithms. The design and optimization of memristive devices for specific AI applications is thus of paramount importance, but still extremely complex, as many different physical mechanisms and their interactions have to be accounted for, which are, in many cases, not fully understood. The high complexity of the physical mechanisms involved and their partial comprehension are currently hampering the development of memristive devices and preventing their optimization. In this work, we tackle the application-oriented optimization of Resistive Random-Access Memory (RRAM) devices using a multiscale modeling platform. The considered platform includes all the involved physical mechanisms (i.e., charge transport and trapping, and ion generation, diffusion, and recombination) and accounts for the 3D electric and temperature field in the device. Thanks to its multiscale nature, the modeling platform allows RRAM devices to be simulated and the microscopic physical mechanisms involved to be investigated, the device performance to be connected to the material’s microscopic properties and geometries, the device electrical characteristics to be predicted, the effect of the forming conditions (i.e., temperature, compliance current, and voltage stress) on the device’s performance and variability to be evaluated, the analog resistance switching to be optimized, and the device’s reliability and failure causes to be investigated. The discussion of the presented simulation results provides useful insights for supporting the application-oriented optimization of RRAM technology according to specific AI applications, for the implementation of either non-volatile memories, deep neural networks, or spiking neural networks.
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spelling pubmed-68620552019-12-05 Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory La Torraca, Paolo Puglisi, Francesco Maria Padovani, Andrea Larcher, Luca Materials (Basel) Article Memristor-based neuromorphic systems have been proposed as a promising alternative to von Neumann computing architectures, which are currently challenged by the ever-increasing computational power required by modern artificial intelligence (AI) algorithms. The design and optimization of memristive devices for specific AI applications is thus of paramount importance, but still extremely complex, as many different physical mechanisms and their interactions have to be accounted for, which are, in many cases, not fully understood. The high complexity of the physical mechanisms involved and their partial comprehension are currently hampering the development of memristive devices and preventing their optimization. In this work, we tackle the application-oriented optimization of Resistive Random-Access Memory (RRAM) devices using a multiscale modeling platform. The considered platform includes all the involved physical mechanisms (i.e., charge transport and trapping, and ion generation, diffusion, and recombination) and accounts for the 3D electric and temperature field in the device. Thanks to its multiscale nature, the modeling platform allows RRAM devices to be simulated and the microscopic physical mechanisms involved to be investigated, the device performance to be connected to the material’s microscopic properties and geometries, the device electrical characteristics to be predicted, the effect of the forming conditions (i.e., temperature, compliance current, and voltage stress) on the device’s performance and variability to be evaluated, the analog resistance switching to be optimized, and the device’s reliability and failure causes to be investigated. The discussion of the presented simulation results provides useful insights for supporting the application-oriented optimization of RRAM technology according to specific AI applications, for the implementation of either non-volatile memories, deep neural networks, or spiking neural networks. MDPI 2019-10-23 /pmc/articles/PMC6862055/ /pubmed/31652682 http://dx.doi.org/10.3390/ma12213461 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
La Torraca, Paolo
Puglisi, Francesco Maria
Padovani, Andrea
Larcher, Luca
Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
title Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
title_full Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
title_fullStr Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
title_full_unstemmed Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
title_short Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
title_sort multiscale modeling for application-oriented optimization of resistive random-access memory
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6862055/
https://www.ncbi.nlm.nih.gov/pubmed/31652682
http://dx.doi.org/10.3390/ma12213461
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