Non-contact characterization of compound optical elements using reflectance confocal microscopy, low-coherence interferometry, and computational ray-tracing

Advances in microscopy have enabled us to see at unprecedented depths and resolutions, even breaking the diffraction-limit by several fold. These improvements have come at the expense of system complexity with microscopes routinely employing multiple objective lenses and custom optical relays. Optimal system design is paramount for imaging performance, but research systems are limited by the use of commercial components because optical prescriptions are often inaccessible. System performance can be further degraded when these components are implemented in nonstandard configurations outside of manufacturer specifications. Here, we describe a method for characterization of compound optical elements including curvatures, material and air-gap thicknesses, and glass types. We present validation data for doublets and a commercial broadband scan lens. Our method is both non-contact and non-destructive, and we believe it addresses a unique gap in optical design that may be extended to broad applications in both research and industrial manufacturing.