Fast fitting of reflectivity data of growing thin films using neural networks

X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. This study shows how a simple artificial neural network model can be used to determine the thickness, roughness and density of thin films of different organi...

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Detalles Bibliográficos
Autores principales: Greco, Alessandro, Starostin, Vladimir, Karapanagiotis, Christos, Hinderhofer, Alexander, Gerlach, Alexander, Pithan, Linus, Liehr, Sascha, Schreiber, Frank, Kowarik, Stefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6878882/
https://www.ncbi.nlm.nih.gov/pubmed/31798360
http://dx.doi.org/10.1107/S1600576719013311

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6878882/
https://www.ncbi.nlm.nih.gov/pubmed/31798360
http://dx.doi.org/10.1107/S1600576719013311

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