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Contact Resonance Atomic Force Microscopy Using Long, Massive Tips

In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler–Bernoulli...

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Detalles Bibliográficos
Autores principales: Jaquez-Moreno, Tony, Aureli, Matteo, Tung, Ryan C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6891549/
https://www.ncbi.nlm.nih.gov/pubmed/31731825
http://dx.doi.org/10.3390/s19224990
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author Jaquez-Moreno, Tony
Aureli, Matteo
Tung, Ryan C.
author_facet Jaquez-Moreno, Tony
Aureli, Matteo
Tung, Ryan C.
author_sort Jaquez-Moreno, Tony
collection PubMed
description In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler–Bernoulli beam theory, whereby the effect of the tip as well as of the sample in contact, modeled as an elastic substrate, are captured by appropriate boundary conditions. A novel interpretation of the flexural and torsional modes of vibration of the cantilever, when not in contact with the sample, is used to estimate the inertia properties of the long, massive tip. Using this information, sample elastic properties are then estimated from the in-contact resonance frequencies of the system. The predictive capability of the proposed model is verified via finite element analysis. Different combinations of cantilever geometry, tip geometry, and sample stiffness are investigated. The model’s accurate predictive ranges are discussed and shown to outperform those of other popular models currently used in contact resonance atomic force microscopy.
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spelling pubmed-68915492019-12-18 Contact Resonance Atomic Force Microscopy Using Long, Massive Tips Jaquez-Moreno, Tony Aureli, Matteo Tung, Ryan C. Sensors (Basel) Article In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler–Bernoulli beam theory, whereby the effect of the tip as well as of the sample in contact, modeled as an elastic substrate, are captured by appropriate boundary conditions. A novel interpretation of the flexural and torsional modes of vibration of the cantilever, when not in contact with the sample, is used to estimate the inertia properties of the long, massive tip. Using this information, sample elastic properties are then estimated from the in-contact resonance frequencies of the system. The predictive capability of the proposed model is verified via finite element analysis. Different combinations of cantilever geometry, tip geometry, and sample stiffness are investigated. The model’s accurate predictive ranges are discussed and shown to outperform those of other popular models currently used in contact resonance atomic force microscopy. MDPI 2019-11-15 /pmc/articles/PMC6891549/ /pubmed/31731825 http://dx.doi.org/10.3390/s19224990 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Jaquez-Moreno, Tony
Aureli, Matteo
Tung, Ryan C.
Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
title Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
title_full Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
title_fullStr Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
title_full_unstemmed Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
title_short Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
title_sort contact resonance atomic force microscopy using long, massive tips
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6891549/
https://www.ncbi.nlm.nih.gov/pubmed/31731825
http://dx.doi.org/10.3390/s19224990
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