Evaluation of serial crystallographic structure determination within megahertz pulse trains

The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whethe...

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Detalles Bibliográficos
Autores principales: Yefanov, Oleksandr, Oberthür, Dominik, Bean, Richard, Wiedorn, Max O., Knoska, Juraj, Pena, Gisel, Awel, Salah, Gumprecht, Lars, Domaracky, Martin, Sarrou, Iosifina, Lourdu Xavier, P., Metz, Markus, Bajt, Saša, Mariani, Valerio, Gevorkov, Yaroslav, White, Thomas A., Tolstikova, Aleksandra, Villanueva-Perez, Pablo, Seuring, Carolin, Aplin, Steve, Estillore, Armando D., Küpper, Jochen, Klyuev, Alexander, Kuhn, Manuela, Laurus, Torsten, Graafsma, Heinz, Monteiro, Diana C. F., Trebbin, Martin, Maia, Filipe R. N. C., Cruz-Mazo, Francisco, Gañán-Calvo, Alfonso M., Heymann, Michael, Darmanin, Connie, Abbey, Brian, Schmidt, Marius, Fromme, Petra, Giewekemeyer, Klaus, Sikorski, Marcin, Graceffa, Rita, Vagovic, Patrik, Kluyver, Thomas, Bergemann, Martin, Fangohr, Hans, Sztuk-Dambietz, Jolanta, Hauf, Steffen, Raab, Natascha, Bondar, Valerii, Mancuso, Adrian P., Chapman, Henry, Barty, Anton
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2019
Materias:
ARTICLES
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6892710/
https://www.ncbi.nlm.nih.gov/pubmed/31832488
http://dx.doi.org/10.1063/1.5124387

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