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Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments

Moderate heat stress accompanied by short episodes of extreme heat during the post-anthesis stage is common in most US wheat growing areas and causes substantial yield losses. Sink strength (grain number) is a key yield limiting factor in modern wheat varieties. Increasing spike fertility (SF) and i...

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Autores principales: Pradhan, Sumit, Babar, Md Ali, Robbins, Kelly, Bai, Guihua, Mason, Richard Esten, Khan, Jahangir, Shahi, Dipendra, Avci, Muhsin, Guo, Jia, Maksud Hossain, Mohammad, Bhatta, Madhav, Mergoum, Mohamed, Asseng, Senthold, Amand, Paul St., Gezan, Salvador, Baik, Byung-Kee, Blount, Ann, Bernardo, Amy
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6895025/
https://www.ncbi.nlm.nih.gov/pubmed/31850009
http://dx.doi.org/10.3389/fpls.2019.01481
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author Pradhan, Sumit
Babar, Md Ali
Robbins, Kelly
Bai, Guihua
Mason, Richard Esten
Khan, Jahangir
Shahi, Dipendra
Avci, Muhsin
Guo, Jia
Maksud Hossain, Mohammad
Bhatta, Madhav
Mergoum, Mohamed
Asseng, Senthold
Amand, Paul St.
Gezan, Salvador
Baik, Byung-Kee
Blount, Ann
Bernardo, Amy
author_facet Pradhan, Sumit
Babar, Md Ali
Robbins, Kelly
Bai, Guihua
Mason, Richard Esten
Khan, Jahangir
Shahi, Dipendra
Avci, Muhsin
Guo, Jia
Maksud Hossain, Mohammad
Bhatta, Madhav
Mergoum, Mohamed
Asseng, Senthold
Amand, Paul St.
Gezan, Salvador
Baik, Byung-Kee
Blount, Ann
Bernardo, Amy
author_sort Pradhan, Sumit
collection PubMed
description Moderate heat stress accompanied by short episodes of extreme heat during the post-anthesis stage is common in most US wheat growing areas and causes substantial yield losses. Sink strength (grain number) is a key yield limiting factor in modern wheat varieties. Increasing spike fertility (SF) and improving the partitioning of assimilates can optimize sink strength which is essential to improve wheat yield potential under a hot and humid environment. A genome-wide association study (GWAS) allows identification of novel quantitative trait loci (QTLs) associated with SF and other partitioning traits that can assist in marker assisted breeding. In this study, GWAS was performed on a soft wheat association mapping panel (SWAMP) comprised of 236 elite lines using 27,466 single nucleotide polymorphisms (SNPs). The panel was phenotyped in two heat stress locations over 3 years. GWAS identified 109 significant marker-trait associations (MTAs) (p ≤ 9.99 x 10−5) related to eight phenotypic traits including SF (a major component of grain number) and spike harvest index (SHI, a major component of grain weight). MTAs detected on chromosomes 1B, 3A, 3B, and 5A were associated with multiple traits and are potentially important targets for selection. More than half of the significant MTAs (60 out of 109) were found in genes encoding different types of proteins related to metabolism, disease, and abiotic stress including heat stress. These MTAs could be potential targets for further validation study and may be used in marker-assisted breeding for improving wheat grain yield under post-anthesis heat stress conditions. This is the first study to identify novel QTLs associated with SF and SHI which represent the major components of grain number and grain weight, respectively, in wheat.
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spelling pubmed-68950252019-12-17 Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments Pradhan, Sumit Babar, Md Ali Robbins, Kelly Bai, Guihua Mason, Richard Esten Khan, Jahangir Shahi, Dipendra Avci, Muhsin Guo, Jia Maksud Hossain, Mohammad Bhatta, Madhav Mergoum, Mohamed Asseng, Senthold Amand, Paul St. Gezan, Salvador Baik, Byung-Kee Blount, Ann Bernardo, Amy Front Plant Sci Plant Science Moderate heat stress accompanied by short episodes of extreme heat during the post-anthesis stage is common in most US wheat growing areas and causes substantial yield losses. Sink strength (grain number) is a key yield limiting factor in modern wheat varieties. Increasing spike fertility (SF) and improving the partitioning of assimilates can optimize sink strength which is essential to improve wheat yield potential under a hot and humid environment. A genome-wide association study (GWAS) allows identification of novel quantitative trait loci (QTLs) associated with SF and other partitioning traits that can assist in marker assisted breeding. In this study, GWAS was performed on a soft wheat association mapping panel (SWAMP) comprised of 236 elite lines using 27,466 single nucleotide polymorphisms (SNPs). The panel was phenotyped in two heat stress locations over 3 years. GWAS identified 109 significant marker-trait associations (MTAs) (p ≤ 9.99 x 10−5) related to eight phenotypic traits including SF (a major component of grain number) and spike harvest index (SHI, a major component of grain weight). MTAs detected on chromosomes 1B, 3A, 3B, and 5A were associated with multiple traits and are potentially important targets for selection. More than half of the significant MTAs (60 out of 109) were found in genes encoding different types of proteins related to metabolism, disease, and abiotic stress including heat stress. These MTAs could be potential targets for further validation study and may be used in marker-assisted breeding for improving wheat grain yield under post-anthesis heat stress conditions. This is the first study to identify novel QTLs associated with SF and SHI which represent the major components of grain number and grain weight, respectively, in wheat. Frontiers Media S.A. 2019-11-29 /pmc/articles/PMC6895025/ /pubmed/31850009 http://dx.doi.org/10.3389/fpls.2019.01481 Text en Copyright © 2019 Pradhan, Babar, Robbins, Bai, Mason, Khan, Shahi, Avci, Guo, Maksud Hossain, Bhatta, Mergoum, Asseng, Amand, Gezan, Baik, Blount and Bernardo http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
spellingShingle Plant Science
Pradhan, Sumit
Babar, Md Ali
Robbins, Kelly
Bai, Guihua
Mason, Richard Esten
Khan, Jahangir
Shahi, Dipendra
Avci, Muhsin
Guo, Jia
Maksud Hossain, Mohammad
Bhatta, Madhav
Mergoum, Mohamed
Asseng, Senthold
Amand, Paul St.
Gezan, Salvador
Baik, Byung-Kee
Blount, Ann
Bernardo, Amy
Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments
title Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments
title_full Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments
title_fullStr Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments
title_full_unstemmed Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments
title_short Understanding the Genetic Basis of Spike Fertility to Improve Grain Number, Harvest Index, and Grain Yield in Wheat Under High Temperature Stress Environments
title_sort understanding the genetic basis of spike fertility to improve grain number, harvest index, and grain yield in wheat under high temperature stress environments
topic Plant Science
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6895025/
https://www.ncbi.nlm.nih.gov/pubmed/31850009
http://dx.doi.org/10.3389/fpls.2019.01481
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