A novel method to remove impulse noise from atomic force microscopy images based on Bayesian compressed sensing

A novel method based on Bayesian compressed sensing is proposed to remove impulse noise from atomic force microscopy (AFM) images. The image denoising problem is transformed into a compressed sensing imaging problem of the AFM. First, two different ways, including interval approach and self-comparis...

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Detalles Bibliográficos
Autores principales: Zhang, Yingxu, Li, Yingzi, Song, Zihang, Wang, Zhenyu, Qian, Jianqiang, Yao, Junen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2019
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6902871/
https://www.ncbi.nlm.nih.gov/pubmed/31886111
http://dx.doi.org/10.3762/bjnano.10.225

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