Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)

A previously unreported tetragonal phase has been discovered in a epitaxially strained GdMnO(3) thin films deposited on (001)-oriented SrTiO(3) substrates by radio frequency (RF) magnetron sputtering. The tetragonal axis of the films grown up to a 35 nm thickness is perpendicular to the film surface...

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Detalles Bibliográficos
Autores principales: Machado, P., Figueiras, F. G., Vilarinho, R., Fernandes, J. R. A., Tavares, P. B., Soares, M. Rosário, Cardoso, S., Silva, J. P. B., Almeida, A., Moreira, J. Agostinho
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6904445/
https://www.ncbi.nlm.nih.gov/pubmed/31822738
http://dx.doi.org/10.1038/s41598-019-55227-2
Descripción
Sumario:A previously unreported tetragonal phase has been discovered in a epitaxially strained GdMnO(3) thin films deposited on (001)-oriented SrTiO(3) substrates by radio frequency (RF) magnetron sputtering. The tetragonal axis of the films grown up to a 35 nm thickness is perpendicular to the film surface and the basal lattice parameters are imposed by the cubic structure of the substrate. Furthermore, the emergence of a spontaneous electric polarization below ~32 K points to the stabilization of an improper ferroelectric phase at low temperatures, which is not observed in bulk GdMnO(3). This work shows how strain engineering can be used to tailor the structure and properties of strongly correlated oxides.

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