Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)

A previously unreported tetragonal phase has been discovered in a epitaxially strained GdMnO(3) thin films deposited on (001)-oriented SrTiO(3) substrates by radio frequency (RF) magnetron sputtering. The tetragonal axis of the films grown up to a 35 nm thickness is perpendicular to the film surface...

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Autores principales: Machado, P., Figueiras, F. G., Vilarinho, R., Fernandes, J. R. A., Tavares, P. B., Soares, M. Rosário, Cardoso, S., Silva, J. P. B., Almeida, A., Moreira, J. Agostinho
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
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Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6904445/
https://www.ncbi.nlm.nih.gov/pubmed/31822738
http://dx.doi.org/10.1038/s41598-019-55227-2
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author Machado, P.
Figueiras, F. G.
Vilarinho, R.
Fernandes, J. R. A.
Tavares, P. B.
Soares, M. Rosário
Cardoso, S.
Silva, J. P. B.
Almeida, A.
Moreira, J. Agostinho
author_facet Machado, P.
Figueiras, F. G.
Vilarinho, R.
Fernandes, J. R. A.
Tavares, P. B.
Soares, M. Rosário
Cardoso, S.
Silva, J. P. B.
Almeida, A.
Moreira, J. Agostinho
author_sort Machado, P.
collection PubMed
description A previously unreported tetragonal phase has been discovered in a epitaxially strained GdMnO(3) thin films deposited on (001)-oriented SrTiO(3) substrates by radio frequency (RF) magnetron sputtering. The tetragonal axis of the films grown up to a 35 nm thickness is perpendicular to the film surface and the basal lattice parameters are imposed by the cubic structure of the substrate. Furthermore, the emergence of a spontaneous electric polarization below ~32 K points to the stabilization of an improper ferroelectric phase at low temperatures, which is not observed in bulk GdMnO(3). This work shows how strain engineering can be used to tailor the structure and properties of strongly correlated oxides.
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spelling pubmed-69044452019-12-13 Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001) Machado, P. Figueiras, F. G. Vilarinho, R. Fernandes, J. R. A. Tavares, P. B. Soares, M. Rosário Cardoso, S. Silva, J. P. B. Almeida, A. Moreira, J. Agostinho Sci Rep Article A previously unreported tetragonal phase has been discovered in a epitaxially strained GdMnO(3) thin films deposited on (001)-oriented SrTiO(3) substrates by radio frequency (RF) magnetron sputtering. The tetragonal axis of the films grown up to a 35 nm thickness is perpendicular to the film surface and the basal lattice parameters are imposed by the cubic structure of the substrate. Furthermore, the emergence of a spontaneous electric polarization below ~32 K points to the stabilization of an improper ferroelectric phase at low temperatures, which is not observed in bulk GdMnO(3). This work shows how strain engineering can be used to tailor the structure and properties of strongly correlated oxides. Nature Publishing Group UK 2019-12-10 /pmc/articles/PMC6904445/ /pubmed/31822738 http://dx.doi.org/10.1038/s41598-019-55227-2 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Machado, P.
Figueiras, F. G.
Vilarinho, R.
Fernandes, J. R. A.
Tavares, P. B.
Soares, M. Rosário
Cardoso, S.
Silva, J. P. B.
Almeida, A.
Moreira, J. Agostinho
Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)
title Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)
title_full Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)
title_fullStr Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)
title_full_unstemmed Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)
title_short Strain-Engineered Tetragonal Phase and Ferroelectricity in GdMnO(3) Thin Films Grown on SrTiO(3) (001)
title_sort strain-engineered tetragonal phase and ferroelectricity in gdmno(3) thin films grown on srtio(3) (001)
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6904445/
https://www.ncbi.nlm.nih.gov/pubmed/31822738
http://dx.doi.org/10.1038/s41598-019-55227-2
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