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Localized Dielectric Loss Heating in Dielectrophoresis Devices

Temperature increases during dielectrophoresis (DEP) can affect the response of biological entities, and ignoring the effect can result in misleading analysis. The heating mechanism of a DEP device is typically considered to be the result of Joule heating and is overlooked without an appropriate ana...

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Autores principales: Kwak, Tae Joon, Hossen, Imtiaz, Bashir, Rashid, Chang, Woo-Jin, Lee, Chung Hoon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6908616/
https://www.ncbi.nlm.nih.gov/pubmed/31831755
http://dx.doi.org/10.1038/s41598-019-55031-y
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author Kwak, Tae Joon
Hossen, Imtiaz
Bashir, Rashid
Chang, Woo-Jin
Lee, Chung Hoon
author_facet Kwak, Tae Joon
Hossen, Imtiaz
Bashir, Rashid
Chang, Woo-Jin
Lee, Chung Hoon
author_sort Kwak, Tae Joon
collection PubMed
description Temperature increases during dielectrophoresis (DEP) can affect the response of biological entities, and ignoring the effect can result in misleading analysis. The heating mechanism of a DEP device is typically considered to be the result of Joule heating and is overlooked without an appropriate analysis. Our experiment and analysis indicate that the heating mechanism is due to the dielectric loss (Debye relaxation). A temperature increase between interdigitated electrodes (IDEs) has been measured with an integrated micro temperature sensor between IDEs to be as high as 70 °C at 1.5 MHz with a 30 V(pp) applied voltage to our ultra-low thermal mass DEP device. Analytical and numerical analysis of the power dissipation due to the dielectric loss are in good agreement with the experiment data.
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spelling pubmed-69086162019-12-16 Localized Dielectric Loss Heating in Dielectrophoresis Devices Kwak, Tae Joon Hossen, Imtiaz Bashir, Rashid Chang, Woo-Jin Lee, Chung Hoon Sci Rep Article Temperature increases during dielectrophoresis (DEP) can affect the response of biological entities, and ignoring the effect can result in misleading analysis. The heating mechanism of a DEP device is typically considered to be the result of Joule heating and is overlooked without an appropriate analysis. Our experiment and analysis indicate that the heating mechanism is due to the dielectric loss (Debye relaxation). A temperature increase between interdigitated electrodes (IDEs) has been measured with an integrated micro temperature sensor between IDEs to be as high as 70 °C at 1.5 MHz with a 30 V(pp) applied voltage to our ultra-low thermal mass DEP device. Analytical and numerical analysis of the power dissipation due to the dielectric loss are in good agreement with the experiment data. Nature Publishing Group UK 2019-12-12 /pmc/articles/PMC6908616/ /pubmed/31831755 http://dx.doi.org/10.1038/s41598-019-55031-y Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Kwak, Tae Joon
Hossen, Imtiaz
Bashir, Rashid
Chang, Woo-Jin
Lee, Chung Hoon
Localized Dielectric Loss Heating in Dielectrophoresis Devices
title Localized Dielectric Loss Heating in Dielectrophoresis Devices
title_full Localized Dielectric Loss Heating in Dielectrophoresis Devices
title_fullStr Localized Dielectric Loss Heating in Dielectrophoresis Devices
title_full_unstemmed Localized Dielectric Loss Heating in Dielectrophoresis Devices
title_short Localized Dielectric Loss Heating in Dielectrophoresis Devices
title_sort localized dielectric loss heating in dielectrophoresis devices
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6908616/
https://www.ncbi.nlm.nih.gov/pubmed/31831755
http://dx.doi.org/10.1038/s41598-019-55031-y
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