A suggested method for setting up GSI profiles on the GE Revolution CT scanner

“GSI Assist” is the automatic exposure control (AEC) system for dual‐energy acquisitions on the GE Revolution CT scanner. This paper describes the user options of GSI Assist, and describes the method developed at UAB Medical Center to simplify the use of GSI Assist without adversely affecting the AE...

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Detalles Bibliográficos
Autor principal: Gauntt, David M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2019
Materias:
Medical Imaging
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6909110/
https://www.ncbi.nlm.nih.gov/pubmed/31833643
http://dx.doi.org/10.1002/acm2.12754

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6909110/
https://www.ncbi.nlm.nih.gov/pubmed/31833643
http://dx.doi.org/10.1002/acm2.12754

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