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Investigation on energy bandgap states of amorphous SiZnSnO thin films
The variation in energy bandgaps of amorphous oxide semiconducting SiZnSnO (a-SZTO) has been investigated by controlling the oxygen partial pressure (O(p)). The systematic change in O(p) during deposition has been used to control the electrical characteristics and energy bandgap of a-SZTO. As O(p) i...
Autores principales: | Lee, Byeong Hyeon, Cho, Kyung-Sang, Lee, Doo-Yong, Sohn, Ahrum, Lee, Ji Ye, Choo, Hyuck, Park, Sungkyun, Kim, Sang-Woo, Kim, Sangsig, Lee, Sang Yeol |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6917747/ https://www.ncbi.nlm.nih.gov/pubmed/31848440 http://dx.doi.org/10.1038/s41598-019-55807-2 |
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