Morphological data on soft ferromagnetic Fe(90)Ta(10) thin films

Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe(90)Ta(10) thin films [1]”. Morphological data confirm...

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Detalles Bibliográficos
Autores principales: Shaji, Surabhi, Mucha, Nikhil R., Fialkova, Svitlana, Kumar, Dhananjay
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Materials Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6920496/
https://www.ncbi.nlm.nih.gov/pubmed/31886330
http://dx.doi.org/10.1016/j.dib.2019.104714
Descripción
Sumario:Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe(90)Ta(10) thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The composition of Fe–Ta clusters, observed on the film surface, was measured using energy dispersive x-ray (EDX) analysis.

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