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Raman Spectra Shift of Few-Layer IV-VI 2D Materials
Raman spectroscopy is the most commonly used method to investigate structures of materials. Recently, few-layered IV-VI 2D materials (SnS, SnSe, GeS, and GeSe) have been found and ignited significant interest in electronic and optical applications. However, unlike few-layer graphene, in which its in...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6925276/ https://www.ncbi.nlm.nih.gov/pubmed/31863038 http://dx.doi.org/10.1038/s41598-019-55577-x |