Full-field spectroscopic measurement of the X-ray beam from a multilayer monochromator using a hyperspectral X-ray camera

Multilayer monochromator devices are commonly used at (imaging) beamlines of synchrotron facilities to shape the X-ray beam to relatively small bandwidth and high intensity. However, stripe artefacts are often observed and can deteriorate the image quality. Although the intensity distribution of the...

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Detalles Bibliográficos
Autores principales: Boone, Matthieu N., Van Assche, Frederic, Vanheule, Sander, Cipiccia, Silvia, Wang, Hongchang, Vincze, Laszlo, Van Hoorebeke, Luc
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6927514/
https://www.ncbi.nlm.nih.gov/pubmed/31868743
http://dx.doi.org/10.1107/S1600577519015212

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6927514/
https://www.ncbi.nlm.nih.gov/pubmed/31868743
http://dx.doi.org/10.1107/S1600577519015212

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