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Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry
In this investigation, we propose an effective method to measure 3D surface profiles of specimens with single-shot imaging. Based on the two-wavelength interferometric principle and spatial phase-shifting technique using a polarization pixelated camera, the proposed system can not only rapidly measu...
Autores principales: | Jeon, Jun Woo, Joo, Ki-Nam |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6929118/ https://www.ncbi.nlm.nih.gov/pubmed/31766448 http://dx.doi.org/10.3390/s19235094 |
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