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Optical characteristics of highly conductive n-type GaN prepared by pulsed sputtering deposition

We have characterized highly conductive Si-doped GaN films with a high electron mobility of 112 cm(2)V(−1)s(−1) at an electron concentration of 2.9 × 10(20) cm(−3), prepared using pulsed sputtering deposition (PSD). With an increase in the doping concentration, the absorption edge was found to shift...

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Detalles Bibliográficos
Autores principales: Ueno, Kohei, Taiga, Fudetani, Kobayashi, Atsushi, Fujioka, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6934540/
https://www.ncbi.nlm.nih.gov/pubmed/31882664
http://dx.doi.org/10.1038/s41598-019-56306-0

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