Cargando…
Simulation studies for characterizing ultrashort bunches using novel polarizable X-band transverse deflection structures
Transverse deflection structures are useful devices for characterizing the longitudinal properties of bunches in electron accelerators. With efforts to produce ever-shorter bunches for applications such as external injection into novel accelerator structures, e.g. plasma cells or dielectric structur...
Autores principales: | Marx, Daniel, Assmann, Ralph W., Craievich, Paolo, Floettmann, Klaus, Grudiev, Alexej, Marchetti, Barbara |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6934589/ https://www.ncbi.nlm.nih.gov/pubmed/31882776 http://dx.doi.org/10.1038/s41598-019-56433-8 |
Ejemplares similares
-
Simulation studies for characterizing ultrashort bunches using novel polarizable X-band transverse deflection structures
por: Marx, Daniel, et al.
Publicado: (2019) -
Longitudinal phase space reconstruction simulation studies using a novel X-band transverse deflecting structure at the SINBAD facility at DESY
por: Marx, Daniel, et al.
Publicado: (2018) -
Experimental demonstration of novel beam characterization using a polarizable X-band transverse deflection structure
por: Marchetti, B, et al.
Publicado: (2021) -
Experimental demonstration of novel beam characterization using a polarizable X-band transverse deflection structure
por: Marchetti, B., et al.
Publicado: (2021) -
Reconstruction of the 3D charge distribution of an electron bunch using a novel variable-polarization transverse deflecting structure (TDS)
por: Marx, D, et al.
Publicado: (2017)