Simulation studies for characterizing ultrashort bunches using novel polarizable X-band transverse deflection structures

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Transverse deflection structures are useful devices for characterizing the longitudinal properties of bunches in electron accelerators. With efforts to produce ever-shorter bunches for applications such as external injection into novel accelerator structures, e.g. plasma cells or dielectric structur...

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Detalles Bibliográficos
Autores principales: Marx, Daniel, Assmann, Ralph W., Craievich, Paolo, Floettmann, Klaus, Grudiev, Alexej, Marchetti, Barbara
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6934589/
https://www.ncbi.nlm.nih.gov/pubmed/31882776
http://dx.doi.org/10.1038/s41598-019-56433-8

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