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Probing Charge Transport Difference in Parallel and Vertical Layered Electronics with Thin Graphite Source/Drain Contacts

In the present study, we aim to help improve the design of van der Waals stacking, i.e., vertical 2D electronics, by probing charge transport differences in both parallel and vertical conducting channels of layered molybdenum disulfide (MoS(2)), with thin graphite acting as source and drain electrod...

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Detalles Bibliográficos
Autores principales: Li, Jiayi, Lee, Ko-Chun, Hsieh, Meng-Hsun, Yang, Shih-Hsien, Chang, Yuan-Ming, Chang, Jen-Kuei, Lin, Che-Yi, Lin, Yen-Fu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6934711/
https://www.ncbi.nlm.nih.gov/pubmed/31882987
http://dx.doi.org/10.1038/s41598-019-56576-8