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Probing Charge Transport Difference in Parallel and Vertical Layered Electronics with Thin Graphite Source/Drain Contacts
In the present study, we aim to help improve the design of van der Waals stacking, i.e., vertical 2D electronics, by probing charge transport differences in both parallel and vertical conducting channels of layered molybdenum disulfide (MoS(2)), with thin graphite acting as source and drain electrod...
Autores principales: | Li, Jiayi, Lee, Ko-Chun, Hsieh, Meng-Hsun, Yang, Shih-Hsien, Chang, Yuan-Ming, Chang, Jen-Kuei, Lin, Che-Yi, Lin, Yen-Fu |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6934711/ https://www.ncbi.nlm.nih.gov/pubmed/31882987 http://dx.doi.org/10.1038/s41598-019-56576-8 |
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