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Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust

BACKGROUND: Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of redu...

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Autores principales: Gong, Biran, Zhu, Wei, Li, Sanyue, Wang, Yuqi, Xu, Lili, Wang, Yi, Zeng, Jian, Fan, Xing, Sha, Lina, Zhang, Haiqin, Qi, Pengfei, Huang, Lin, Chen, Guoyue, Zhou, Yonghong, Kang, Houyang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6935081/
https://www.ncbi.nlm.nih.gov/pubmed/31881925
http://dx.doi.org/10.1186/s12870-019-2208-x
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author Gong, Biran
Zhu, Wei
Li, Sanyue
Wang, Yuqi
Xu, Lili
Wang, Yi
Zeng, Jian
Fan, Xing
Sha, Lina
Zhang, Haiqin
Qi, Pengfei
Huang, Lin
Chen, Guoyue
Zhou, Yonghong
Kang, Houyang
author_facet Gong, Biran
Zhu, Wei
Li, Sanyue
Wang, Yuqi
Xu, Lili
Wang, Yi
Zeng, Jian
Fan, Xing
Sha, Lina
Zhang, Haiqin
Qi, Pengfei
Huang, Lin
Chen, Guoyue
Zhou, Yonghong
Kang, Houyang
author_sort Gong, Biran
collection PubMed
description BACKGROUND: Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of reducing fungicide applications to combat these diseases. Elymus repens (2n = 6x = 42, StStStStHH) is a potentially useful germplasm of FHB and stripe rust resistance for wheat improvement. RESULTS: Here, we report the development and characterization of two wheat–E. repens lines derived from the progeny of common wheat–E. repens hybrids. Cytological studies indicated that the mean chromosome configuration of K15–1192-2 and K15–1194-2 at meiosis were 2n = 42 = 0.86 I + 17.46 II (ring) + 3.11 II (rod) and 2n = 42 = 2.45 I + 14.17 II (ring) + 5.50 II (rod) + 0.07 III, respectively. Genomic and fluorescence in situ hybridization karyotyping and simple sequence repeats markers revealed that K15–1192-2 was a wheat–E. repens 3D/?St double terminal chromosomal translocation line. Line K15–1194-2 was identified as harboring a pair of 7DS/?StL Robertsonian translocations and one 3D/?St double terminal translocational chromosome. Further analyses using specific expressed sequence tag-SSR markers confirmed that the wheat–E. repens translocations involved the 3St chromatin in both lines. Furthermore, compared with the wheat parent Chuannong16, K15–1192-2 and K15–1194-2 expressed high levels of resistance to FHB and stripe rust pathogens prevalent in China. CONCLUSIONS: Thus, this study has determined that the chromosome 3St of E. repens harbors gene(s) highly resistant to FHB and stripe rust, and chromatin of 3St introgressed into wheat chromosomes completely presented the resistance, indicating the feasibility of using these translocation lines as novel material for breeding resistant wheat cultivars and alien gene mining.
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spelling pubmed-69350812019-12-30 Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust Gong, Biran Zhu, Wei Li, Sanyue Wang, Yuqi Xu, Lili Wang, Yi Zeng, Jian Fan, Xing Sha, Lina Zhang, Haiqin Qi, Pengfei Huang, Lin Chen, Guoyue Zhou, Yonghong Kang, Houyang BMC Plant Biol Research Article BACKGROUND: Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of reducing fungicide applications to combat these diseases. Elymus repens (2n = 6x = 42, StStStStHH) is a potentially useful germplasm of FHB and stripe rust resistance for wheat improvement. RESULTS: Here, we report the development and characterization of two wheat–E. repens lines derived from the progeny of common wheat–E. repens hybrids. Cytological studies indicated that the mean chromosome configuration of K15–1192-2 and K15–1194-2 at meiosis were 2n = 42 = 0.86 I + 17.46 II (ring) + 3.11 II (rod) and 2n = 42 = 2.45 I + 14.17 II (ring) + 5.50 II (rod) + 0.07 III, respectively. Genomic and fluorescence in situ hybridization karyotyping and simple sequence repeats markers revealed that K15–1192-2 was a wheat–E. repens 3D/?St double terminal chromosomal translocation line. Line K15–1194-2 was identified as harboring a pair of 7DS/?StL Robertsonian translocations and one 3D/?St double terminal translocational chromosome. Further analyses using specific expressed sequence tag-SSR markers confirmed that the wheat–E. repens translocations involved the 3St chromatin in both lines. Furthermore, compared with the wheat parent Chuannong16, K15–1192-2 and K15–1194-2 expressed high levels of resistance to FHB and stripe rust pathogens prevalent in China. CONCLUSIONS: Thus, this study has determined that the chromosome 3St of E. repens harbors gene(s) highly resistant to FHB and stripe rust, and chromatin of 3St introgressed into wheat chromosomes completely presented the resistance, indicating the feasibility of using these translocation lines as novel material for breeding resistant wheat cultivars and alien gene mining. BioMed Central 2019-12-27 /pmc/articles/PMC6935081/ /pubmed/31881925 http://dx.doi.org/10.1186/s12870-019-2208-x Text en © The Author(s). 2019 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated.
spellingShingle Research Article
Gong, Biran
Zhu, Wei
Li, Sanyue
Wang, Yuqi
Xu, Lili
Wang, Yi
Zeng, Jian
Fan, Xing
Sha, Lina
Zhang, Haiqin
Qi, Pengfei
Huang, Lin
Chen, Guoyue
Zhou, Yonghong
Kang, Houyang
Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
title Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
title_full Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
title_fullStr Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
title_full_unstemmed Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
title_short Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
title_sort molecular cytogenetic characterization of wheat–elymus repens chromosomal translocation lines with resistance to fusarium head blight and stripe rust
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6935081/
https://www.ncbi.nlm.nih.gov/pubmed/31881925
http://dx.doi.org/10.1186/s12870-019-2208-x
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