Cargando…
Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
BACKGROUND: Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of redu...
Autores principales: | , , , , , , , , , , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
BioMed Central
2019
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6935081/ https://www.ncbi.nlm.nih.gov/pubmed/31881925 http://dx.doi.org/10.1186/s12870-019-2208-x |
_version_ | 1783483513226395648 |
---|---|
author | Gong, Biran Zhu, Wei Li, Sanyue Wang, Yuqi Xu, Lili Wang, Yi Zeng, Jian Fan, Xing Sha, Lina Zhang, Haiqin Qi, Pengfei Huang, Lin Chen, Guoyue Zhou, Yonghong Kang, Houyang |
author_facet | Gong, Biran Zhu, Wei Li, Sanyue Wang, Yuqi Xu, Lili Wang, Yi Zeng, Jian Fan, Xing Sha, Lina Zhang, Haiqin Qi, Pengfei Huang, Lin Chen, Guoyue Zhou, Yonghong Kang, Houyang |
author_sort | Gong, Biran |
collection | PubMed |
description | BACKGROUND: Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of reducing fungicide applications to combat these diseases. Elymus repens (2n = 6x = 42, StStStStHH) is a potentially useful germplasm of FHB and stripe rust resistance for wheat improvement. RESULTS: Here, we report the development and characterization of two wheat–E. repens lines derived from the progeny of common wheat–E. repens hybrids. Cytological studies indicated that the mean chromosome configuration of K15–1192-2 and K15–1194-2 at meiosis were 2n = 42 = 0.86 I + 17.46 II (ring) + 3.11 II (rod) and 2n = 42 = 2.45 I + 14.17 II (ring) + 5.50 II (rod) + 0.07 III, respectively. Genomic and fluorescence in situ hybridization karyotyping and simple sequence repeats markers revealed that K15–1192-2 was a wheat–E. repens 3D/?St double terminal chromosomal translocation line. Line K15–1194-2 was identified as harboring a pair of 7DS/?StL Robertsonian translocations and one 3D/?St double terminal translocational chromosome. Further analyses using specific expressed sequence tag-SSR markers confirmed that the wheat–E. repens translocations involved the 3St chromatin in both lines. Furthermore, compared with the wheat parent Chuannong16, K15–1192-2 and K15–1194-2 expressed high levels of resistance to FHB and stripe rust pathogens prevalent in China. CONCLUSIONS: Thus, this study has determined that the chromosome 3St of E. repens harbors gene(s) highly resistant to FHB and stripe rust, and chromatin of 3St introgressed into wheat chromosomes completely presented the resistance, indicating the feasibility of using these translocation lines as novel material for breeding resistant wheat cultivars and alien gene mining. |
format | Online Article Text |
id | pubmed-6935081 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | BioMed Central |
record_format | MEDLINE/PubMed |
spelling | pubmed-69350812019-12-30 Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust Gong, Biran Zhu, Wei Li, Sanyue Wang, Yuqi Xu, Lili Wang, Yi Zeng, Jian Fan, Xing Sha, Lina Zhang, Haiqin Qi, Pengfei Huang, Lin Chen, Guoyue Zhou, Yonghong Kang, Houyang BMC Plant Biol Research Article BACKGROUND: Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of reducing fungicide applications to combat these diseases. Elymus repens (2n = 6x = 42, StStStStHH) is a potentially useful germplasm of FHB and stripe rust resistance for wheat improvement. RESULTS: Here, we report the development and characterization of two wheat–E. repens lines derived from the progeny of common wheat–E. repens hybrids. Cytological studies indicated that the mean chromosome configuration of K15–1192-2 and K15–1194-2 at meiosis were 2n = 42 = 0.86 I + 17.46 II (ring) + 3.11 II (rod) and 2n = 42 = 2.45 I + 14.17 II (ring) + 5.50 II (rod) + 0.07 III, respectively. Genomic and fluorescence in situ hybridization karyotyping and simple sequence repeats markers revealed that K15–1192-2 was a wheat–E. repens 3D/?St double terminal chromosomal translocation line. Line K15–1194-2 was identified as harboring a pair of 7DS/?StL Robertsonian translocations and one 3D/?St double terminal translocational chromosome. Further analyses using specific expressed sequence tag-SSR markers confirmed that the wheat–E. repens translocations involved the 3St chromatin in both lines. Furthermore, compared with the wheat parent Chuannong16, K15–1192-2 and K15–1194-2 expressed high levels of resistance to FHB and stripe rust pathogens prevalent in China. CONCLUSIONS: Thus, this study has determined that the chromosome 3St of E. repens harbors gene(s) highly resistant to FHB and stripe rust, and chromatin of 3St introgressed into wheat chromosomes completely presented the resistance, indicating the feasibility of using these translocation lines as novel material for breeding resistant wheat cultivars and alien gene mining. BioMed Central 2019-12-27 /pmc/articles/PMC6935081/ /pubmed/31881925 http://dx.doi.org/10.1186/s12870-019-2208-x Text en © The Author(s). 2019 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated. |
spellingShingle | Research Article Gong, Biran Zhu, Wei Li, Sanyue Wang, Yuqi Xu, Lili Wang, Yi Zeng, Jian Fan, Xing Sha, Lina Zhang, Haiqin Qi, Pengfei Huang, Lin Chen, Guoyue Zhou, Yonghong Kang, Houyang Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust |
title | Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust |
title_full | Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust |
title_fullStr | Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust |
title_full_unstemmed | Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust |
title_short | Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust |
title_sort | molecular cytogenetic characterization of wheat–elymus repens chromosomal translocation lines with resistance to fusarium head blight and stripe rust |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6935081/ https://www.ncbi.nlm.nih.gov/pubmed/31881925 http://dx.doi.org/10.1186/s12870-019-2208-x |
work_keys_str_mv | AT gongbiran molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT zhuwei molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT lisanyue molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT wangyuqi molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT xulili molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT wangyi molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT zengjian molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT fanxing molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT shalina molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT zhanghaiqin molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT qipengfei molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT huanglin molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT chenguoyue molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT zhouyonghong molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust AT kanghouyang molecularcytogeneticcharacterizationofwheatelymusrepenschromosomaltranslocationlineswithresistancetofusariumheadblightandstriperust |