Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

With the emergence of X-ray free-electron lasers, it is possible to investigate the structure of nanoscale samples by employing coherent diffractive imaging in the X-ray spectral regime. In this work, we developed a refinement method for structure reconstruction applicable to low-quality coherent di...

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Detalles Bibliográficos
Autores principales: Nishiyama, Toshiyuki, Niozu, Akinobu, Bostedt, Christoph, Ferguson, Ken R., Sato, Yuhiro, Hutchison, Christopher, Nagaya, Kiyonobu, Fukuzawa, Hironobu, Motomura, Koji, Wada, Shin-ichi, Sakai, Tsukasa, Matsunami, Kenji, Matsuda, Kazuhiro, Tachibana, Tetsuya, Ito, Yuta, Xu, Weiqing, Mondal, Subhendu, Umemoto, Takayuki, Nicolas, Christophe, Miron, Catalin, Kameshima, Takashi, Joti, Yasumasa, Tono, Kensuke, Hatsui, Takaki, Yabashi, Makina, Ueda, Kiyoshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6949595/
https://www.ncbi.nlm.nih.gov/pubmed/31949900
http://dx.doi.org/10.1107/S2052252519014222

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6949595/
https://www.ncbi.nlm.nih.gov/pubmed/31949900
http://dx.doi.org/10.1107/S2052252519014222

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