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A review of demodulation techniques for multifrequency atomic force microscopy

This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a...

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Detalles Bibliográficos
Autores principales: Harcombe, David M, Ruppert, Michael G, Fleming, Andrew J
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6964647/
https://www.ncbi.nlm.nih.gov/pubmed/31976199
http://dx.doi.org/10.3762/bjnano.11.8
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author Harcombe, David M
Ruppert, Michael G
Fleming, Andrew J
author_facet Harcombe, David M
Ruppert, Michael G
Fleming, Andrew J
author_sort Harcombe, David M
collection PubMed
description This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging.
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spelling pubmed-69646472020-01-23 A review of demodulation techniques for multifrequency atomic force microscopy Harcombe, David M Ruppert, Michael G Fleming, Andrew J Beilstein J Nanotechnol Review This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging. Beilstein-Institut 2020-01-07 /pmc/articles/PMC6964647/ /pubmed/31976199 http://dx.doi.org/10.3762/bjnano.11.8 Text en Copyright © 2020, Harcombe et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Review
Harcombe, David M
Ruppert, Michael G
Fleming, Andrew J
A review of demodulation techniques for multifrequency atomic force microscopy
title A review of demodulation techniques for multifrequency atomic force microscopy
title_full A review of demodulation techniques for multifrequency atomic force microscopy
title_fullStr A review of demodulation techniques for multifrequency atomic force microscopy
title_full_unstemmed A review of demodulation techniques for multifrequency atomic force microscopy
title_short A review of demodulation techniques for multifrequency atomic force microscopy
title_sort review of demodulation techniques for multifrequency atomic force microscopy
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6964647/
https://www.ncbi.nlm.nih.gov/pubmed/31976199
http://dx.doi.org/10.3762/bjnano.11.8
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