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Effects of growth technique on the microstructure of CuInSe(2) ternary semiconductor compound

X-ray diffraction (XRD) and Energy-dispersive X-ray fluorescence spectrometer (EDXRF) are employed to investigate the microstructure of bulk [Formula: see text] specimens grown through the Bridgman technique and traveling heater process, respectively. We investigate the lattice parameters, grain siz...

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Detalles Bibliográficos
Autores principales:	Mobarak, M., Zied, M.A., Mostafa, Massaud, Ashari, M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Elsevier 2020
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6974771/ https://www.ncbi.nlm.nih.gov/pubmed/31993518 http://dx.doi.org/10.1016/j.heliyon.2020.e03196

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